Machine learning accelerates the materials discovery
J Fang, M Xie, X He, J Zhang, J Hu, Y Chen… - Materials Today …, 2022 - Elsevier
As the big data generated by the development of modern experiments and computing
technology becomes more and more accessible, the material design method based on …
technology becomes more and more accessible, the material design method based on …
Few-shot fault diagnosis of rolling bearing under variable working conditions based on ensemble meta-learning
C Che, H Wang, M Xiong, X Ni - Digital Signal Processing, 2022 - Elsevier
Accurate fault diagnosis of rolling bearing under variable working conditions can ensure that
the rotating machinery run in a safety, reliable and efficient way. In this paper, we propose …
the rotating machinery run in a safety, reliable and efficient way. In this paper, we propose …
[HTML][HTML] Data-driven simulation-based decision support system for resource allocation in industry 4.0 and smart manufacturing
Data-driven simulation (DDS) is fundamental to analytical and decision-support
technologies in Industry 4.0 and smart manufacturing. This study investigates the potential of …
technologies in Industry 4.0 and smart manufacturing. This study investigates the potential of …
Meta-learned and TCAD-assisted sampling in semiconductor laser annealing
TS Rawat, CY Chang, YW Feng, SW Chen… - ACS …, 2022 - ACS Publications
While applying machine learning (ML) to semiconductor manufacturing is prevalent, an
efficient way to sample the search space has not been explored much in key processes such …
efficient way to sample the search space has not been explored much in key processes such …
Comparative Analysis of Machine Learning Regression Models for Unknown Dynamics
JC Ordoñez, P Ferguson - IEEE Journal of Radio Frequency …, 2023 - ieeexplore.ieee.org
System identification methods can enable scientists and engineers to model a system for
analysis, estimation, or activity planning. Machine Learning (ML) regression algorithms are a …
analysis, estimation, or activity planning. Machine Learning (ML) regression algorithms are a …
A Meta-Learning Reinforcement Training Method for Machine Learning Image-To-Image Optical Proximity Correction
A Lin - 2023 - engrxiv.org
As the scaling down of semiconductor manufacturing nodes, optical proximity correction
(OPC) has become more and more crucial, where the OPC using machine learning to …
(OPC) has become more and more crucial, where the OPC using machine learning to …
Few-Shot Scene Classification with Attention Mechanism in Remote Sensing.
Z Duona, Z Hongjia, LU Yuanyao… - Journal of …, 2024 - search.ebscohost.com
Remote sensing scene classification is a hot research topic in the field of computer vision,
and it is of great significance to semantic understanding of remote sensing images. At …
and it is of great significance to semantic understanding of remote sensing images. At …
[PDF][PDF] Meta-Learning and TCAD-Assisted Sampling in Semiconductor Laser Annealing
AL Shieh - researchgate.net
While there has been significant effort in applying machine learning in semiconductor
manufacturing, an efficient way to sample the search space has not been explored much …
manufacturing, an efficient way to sample the search space has not been explored much …