Atomically precise placement of single dopants in Si

SR Schofield, NJ Curson, MY Simmons, FJ Rueß… - Physical review …, 2003 - APS
We demonstrate the controlled incorporation of P dopant atoms in Si (001), presenting a
new path toward the creation of atomic-scale electronic devices. We present a detailed study …

Nanostructured surfaces: challenges and frontiers in nanotechnology

F Rosei - Journal of Physics: Condensed Matter, 2004 - iopscience.iop.org
Nanostructured surfaces can be broadly defined as substrates in which the typical features
have dimensions in the range 1–100 nm (although the upper limit of 100 nm may be relaxed …

Toward atomic-scale device fabrication in silicon using scanning probe microscopy

FJ Ruess, L Oberbeck, MY Simmons, KEJ Goh… - Nano Letters, 2004 - ACS Publications
We present a complete fabrication process for the creation of robust nano-and atomic-scale
devices in silicon using a scanning tunneling microscope (STM). In particular we develop …

Optically driven silicon-based quantum gates with potential for high-temperature operation

AM Stoneham, AJ Fisher… - Journal of Physics …, 2003 - iopscience.iop.org
We propose a new approach to constructing gates for quantum information processing,
exploiting the properties of impurities in silicon. Quantum information, embodied in electron …

Advances in ultrashallow doping of silicon

C Zhang, S Chang, Y Dan - Advances in Physics: X, 2021 - Taylor & Francis
Ultrashallow doping is required for both classical field-effect transistors in integrated circuits
and revolutionary quantum devices in quantum computing. In this review, we give a brief …

Atomic-scale patterning of arsenic in silicon by scanning tunneling microscopy

TJZ Stock, O Warschkow, PC Constantinou, J Li… - ACS …, 2020 - ACS Publications
Over the past two decades, prototype devices for future classical and quantum computing
technologies have been fabricated by using scanning tunneling microscopy and hydrogen …

Nanoscale imaging of mobile carriers and trapped charges in delta doped silicon p–n junctions

G Gramse, A Kölker, T Škereň, TJZ Stock, G Aeppli… - Nature …, 2020 - nature.com
Integrated circuits and certain silicon-based quantum devices require the precise positioning
of dopant nanostructures, and hydrogen resist lithography can be used to fabricate such …

Nondestructive imaging of atomically thin nanostructures buried in silicon

G Gramse, A Kölker, T Lim, TJZ Stock, H Solanki… - Science …, 2017 - science.org
It is now possible to create atomically thin regions of dopant atoms in silicon patterned with
lateral dimensions ranging from the atomic scale (angstroms) to micrometers. These …

Impact of incorporation kinetics on device fabrication with atomic precision

JA Ivie, Q Campbell, JC Koepke, MI Brickson… - Physical Review …, 2021 - APS
Scanning tunneling microscope lithography can be used to create nanoelectronic devices in
which dopant atoms are precisely positioned in a Si lattice within approximately 1 nm of a …

Reaction of BCl3 with H-and Cl-terminated Si (1 0 0) as a pathway for selective, monolayer doping through wet chemistry

D Silva-Quinones, C He, RE Butera, GT Wang… - Applied surface …, 2020 - Elsevier
The reaction of boron trichloride with the H-and Cl-terminated Si (1 0 0) surfaces was
investigated to understand the interaction of this molecule with the surface for designing wet …