SiC detectors: A review on the use of silicon carbide as radiation detection material

M De Napoli - Frontiers in physics, 2022 - frontiersin.org
Silicon Carbide (SiC) is a wide bandgap semiconductor with many excellent properties that
make it one of the most promising and well-studied materials for radiation particle detection …

4H-SiC Schottky barrier diodes as radiation detectors: A review

I Capan - Electronics, 2022 - mdpi.com
In this review paper, an overview of the application of n-type 4H-SiC Schottky barrier diodes
(SBDs) as radiation detectors is given. We have chosen 4H-SiC SBDs among other …

Silicon carbide diodes for neutron detection

J Coutinho, VJB Torres, I Capan, T Brodar… - Nuclear Instruments and …, 2021 - Elsevier
In the last two decades we have assisted to a rush towards finding a 3 He-replacing
technology capable of detecting neutrons emitted from fissile isotopes. The demand stems …

Radiation Defects Created in n‐Type 4H‐SiC by Electron Irradiation in the Energy Range of 1–10 MeV

P Hazdra, J Vobecký - physica status solidi (a), 2019 - Wiley Online Library
Radiation damage produced in 4H‐SiC n‐epilayers by electrons of different energies is
presented. Junction barrier Schottky power SiC diodes are irradiated with 1.05, 2.1, 5, and …

Influence of neutron radiation on majority and minority carrier traps in n-type 4H-SiC

I Capan, T Brodar, Y Yamazaki, Y Oki… - Nuclear Instruments and …, 2020 - Elsevier
We report on influence of neutron radiation on majority and minority carrier traps in n-type 4
H-SiC. Together with the increase of the well-known carbon vacancy (VC) majority carrier …

M-center in 4H-SiC: Isothermal DLTS and first principles modeling studies

I Capan, T Brodar, R Bernat, Ž Pastuović… - Journal of applied …, 2021 - pubs.aip.org
We report on a bistable defect known as M-center, here introduced in n-type 4H-SiC by 2
MeV He ion implantation. Deep levels of the M-center are investigated by means of junction …

Response of 4h-sic detectors to ionizing particles

R Bernat, I Capan, L Bakrač, T Brodar, T Makino… - Crystals, 2020 - mdpi.com
We report the response of newly designed 4H-SiC Schottky barrier diode (SBD) detector
prototype to alpha and gamma radiation. We studied detectors of three different active area …

Characterisation of negative-U defects in semiconductors

J Coutinho, VP Markevich… - Journal of Physics …, 2020 - iopscience.iop.org
This review aims at providing a retrospective, as well as a description of the state-of-the-art
and future prospects regarding the theoretical and experimental characterisation of negative …

Anisotropic and plane-selective migration of the carbon vacancy in SiC: Theory and experiment

ME Bathen, J Coutinho, HM Ayedh, J Ul Hassan… - Physical Review B, 2019 - APS
We investigate the migration mechanism of the carbon vacancy (VC) in silicon carbide (SiC)
using a combination of theoretical and experimental methodologies. The VC, commonly …

[HTML][HTML] M-center in low-energy electron irradiated 4H-SiC

T Knežević, A Hadžipašić, T Ohshima, T Makino… - Applied physics …, 2022 - pubs.aip.org
We report on the low-energy electron irradiated 4H-SiC material studied by means of deep-
level transient spectroscopy (DLTS) and Laplace-DLTS. Electron irradiation has introduced …