SiC detectors: A review on the use of silicon carbide as radiation detection material
M De Napoli - Frontiers in physics, 2022 - frontiersin.org
Silicon Carbide (SiC) is a wide bandgap semiconductor with many excellent properties that
make it one of the most promising and well-studied materials for radiation particle detection …
make it one of the most promising and well-studied materials for radiation particle detection …
4H-SiC Schottky barrier diodes as radiation detectors: A review
I Capan - Electronics, 2022 - mdpi.com
In this review paper, an overview of the application of n-type 4H-SiC Schottky barrier diodes
(SBDs) as radiation detectors is given. We have chosen 4H-SiC SBDs among other …
(SBDs) as radiation detectors is given. We have chosen 4H-SiC SBDs among other …
Silicon carbide diodes for neutron detection
In the last two decades we have assisted to a rush towards finding a 3 He-replacing
technology capable of detecting neutrons emitted from fissile isotopes. The demand stems …
technology capable of detecting neutrons emitted from fissile isotopes. The demand stems …
Radiation Defects Created in n‐Type 4H‐SiC by Electron Irradiation in the Energy Range of 1–10 MeV
Radiation damage produced in 4H‐SiC n‐epilayers by electrons of different energies is
presented. Junction barrier Schottky power SiC diodes are irradiated with 1.05, 2.1, 5, and …
presented. Junction barrier Schottky power SiC diodes are irradiated with 1.05, 2.1, 5, and …
Influence of neutron radiation on majority and minority carrier traps in n-type 4H-SiC
I Capan, T Brodar, Y Yamazaki, Y Oki… - Nuclear Instruments and …, 2020 - Elsevier
We report on influence of neutron radiation on majority and minority carrier traps in n-type 4
H-SiC. Together with the increase of the well-known carbon vacancy (VC) majority carrier …
H-SiC. Together with the increase of the well-known carbon vacancy (VC) majority carrier …
M-center in 4H-SiC: Isothermal DLTS and first principles modeling studies
I Capan, T Brodar, R Bernat, Ž Pastuović… - Journal of applied …, 2021 - pubs.aip.org
We report on a bistable defect known as M-center, here introduced in n-type 4H-SiC by 2
MeV He ion implantation. Deep levels of the M-center are investigated by means of junction …
MeV He ion implantation. Deep levels of the M-center are investigated by means of junction …
Response of 4h-sic detectors to ionizing particles
We report the response of newly designed 4H-SiC Schottky barrier diode (SBD) detector
prototype to alpha and gamma radiation. We studied detectors of three different active area …
prototype to alpha and gamma radiation. We studied detectors of three different active area …
Characterisation of negative-U defects in semiconductors
J Coutinho, VP Markevich… - Journal of Physics …, 2020 - iopscience.iop.org
This review aims at providing a retrospective, as well as a description of the state-of-the-art
and future prospects regarding the theoretical and experimental characterisation of negative …
and future prospects regarding the theoretical and experimental characterisation of negative …
Anisotropic and plane-selective migration of the carbon vacancy in SiC: Theory and experiment
We investigate the migration mechanism of the carbon vacancy (VC) in silicon carbide (SiC)
using a combination of theoretical and experimental methodologies. The VC, commonly …
using a combination of theoretical and experimental methodologies. The VC, commonly …
[HTML][HTML] M-center in low-energy electron irradiated 4H-SiC
T Knežević, A Hadžipašić, T Ohshima, T Makino… - Applied physics …, 2022 - pubs.aip.org
We report on the low-energy electron irradiated 4H-SiC material studied by means of deep-
level transient spectroscopy (DLTS) and Laplace-DLTS. Electron irradiation has introduced …
level transient spectroscopy (DLTS) and Laplace-DLTS. Electron irradiation has introduced …