[HTML][HTML] Research progress on bonding wire for microelectronic packaging

H Zhou, Y Zhang, J Cao, C Su, C Li, A Chang, B An - Micromachines, 2023 - mdpi.com
Wire bonding is still the most popular chip interconnect technology in microelectronic
packaging and will not be replaced by other interconnect methods for a long time in the …

[图书][B] Copper wire bonding

PS Chauhan, A Choubey, ZW Zhong, MG Pecht… - 2014 - Springer
Chapter 1 gives an introduction to Cu wire bonding technology. The advantages of Cu over
Au, such as lower cost, higher mechanical strength, and higher electrical and thermal …

Investigation on Structural Stability, Mechanical Properties of AuAl2 Doped with Y, Sc and Ta Based by First-principles

J Lu, M Zhan, J Yu, X Yu, Y Duan, M Xu, W Lu… - Materials Today …, 2024 - Elsevier
In this work, in order to provide theoretical data for further research on preparing AuAl 2 alloy
to screen suitable elements that can improve the ductility of AuAl 2, the first-principles …

Wafer-level vacuum sealing by transfer bonding of silicon caps for small footprint and ultra-thin MEMS packages

X Wang, SJ Bleiker, P Edinger… - Journal of …, 2019 - ieeexplore.ieee.org
Vacuum and hermetic packaging is a critical requirement for optimal performance of many
micro-electromechanical systems (MEMS), vacuum electronics, and quantum devices …

[HTML][HTML] Machine learning formation enthalpies of intermetallics

Z Zhang, M Li, K Flores, R Mishra - Journal of Applied Physics, 2020 - pubs.aip.org
Developing fast and accurate methods to discover intermetallic compounds is relevant for
alloy design. While density-functional-theory (DFT)-based methods have accelerated design …

Microstructure, tensile mechanical properties and electrical fatigue mechanism of a microalloyed copper wire

JR Zhao, YC Lin, FY Hung - Journal of Electronic Materials, 2022 - Springer
In this study, trace quantities of silver, palladium, and gold were added to 5 N pure copper
wires to prepare microalloyed copper (MAC) wires. The mechanical properties and electrical …

[HTML][HTML] Extended reliability of gold and copper ball bonds in microelectronic packaging

CL Gan, C Francis, BL Chan, U Hashim - gold Bulletin, 2013 - Springer
Wire bonding is the predominant mode of interconnection in microelectronic packaging.
Gold wire bonding has been refined again and again to retain control of interconnect …

Behavior of intermetallics formation and evolution in Ag–8Au–3Pd alloy wire bonds

R Guo, T Hang, D Mao, M Li, K Qian, Z Lv… - Journal of alloys and …, 2014 - Elsevier
Abstract Ag–8Au–3Pd alloy wire has shown promise as an economical substitute for gold
wire interconnects from integrated circuits to substrates. This work is undertaken to gain a …

Formation and growth of intermetallics in an annealing-twinned Ag-8Au-3Pd wire bonding package during reliability tests

TH Chuang, CC Chang, CH Chuang… - IEEE Transactions …, 2012 - ieeexplore.ieee.org
Wire bonding on Al pad packages with an innovative annealing twinned Ag-8Au-3Pd alloy
wire results in a sufficient interfacial intermetallic layer at the initial as-bonded stage, while …

Kinetics of diffusion and phase formation in a solid-state reaction in Al/Au thin films

RR Altunin, ET Moiseenko, SM Zharkov - Journal of Alloys and Compounds, 2024 - Elsevier
The kinetics of diffusion and formation of Al-Au intermetallic compounds in a solid-state
reaction between layers of aluminum and gold has been studied by the method of in situ …