Cation profiling of passive films on stainless steel formed in sulphuric and acetic acid by deconvolution of angle-resolved X-ray photoelectron spectra
J Högström, W Fredriksson, K Edstrom, F Björefors… - Applied surface …, 2013 - Elsevier
An approach for determining depth gradients of metal-ion concentrations in passive films on
stainless steel using angle-resolved X-ray photoelectron spectroscopy (ARXPS) is …
stainless steel using angle-resolved X-ray photoelectron spectroscopy (ARXPS) is …
Depth profiling of the passive layer on stainless steel using photoelectron spectroscopy
W Fredriksson - 2012 - diva-portal.org
Corrosion is a reaction between the steel and the environment which is in many cases
detrimental to the material. Despite formation of protective passive films on the steel surface …
detrimental to the material. Despite formation of protective passive films on the steel surface …
On the choice of tuning parameters for use with Robust GCV, Modified GCV and the Discrepancy Principle in the inversion of ARXPS data
D Peykov, RW Paynter - Journal of Electron Spectroscopy and Related …, 2014 - Elsevier
Composition depth profiles were extracted from simulated ARXPS data using regularization,
with the regularization parameter determined by three different methods (Robust GCV …
with the regularization parameter determined by three different methods (Robust GCV …
Comparison of parameter choice methods for the analytical inversion of ARXPS data
D Peykov, RW Paynter - Journal of Electron Spectroscopy and Related …, 2014 - Elsevier
Using 0th order Tikhonov regularization, we recovered concentration-depth profiles from
simulated noisy ARXPS data using nine candidate methods for the selection of the …
simulated noisy ARXPS data using nine candidate methods for the selection of the …
[PDF][PDF] Formation of Al/Au Bimetallic Interface Studied by Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS)
Y Polyak - Journal of Materials Science and Engineering A, 2015 - davidpublisher.com
ARXPS (Angle-resolved X-ray photoelectron spectroscopy) measurements were performed
on the thin aluminum films deposited on the gold polycrystalline substrate kept at the …
on the thin aluminum films deposited on the gold polycrystalline substrate kept at the …
Investigation of an iterative matrix method for the inversion of ARXPS data
RW Paynter, D Peykov - Surface and Interface Analysis, 2016 - Wiley Online Library
Mathematical simulations were used to evaluate an iterative, regularized matrix approach to
the recovery of composition depth profiles from ARXPS data containing 1, 3, 5, 7 or 9 …
the recovery of composition depth profiles from ARXPS data containing 1, 3, 5, 7 or 9 …