In semiconductor manufacturing, defect detection is pivotal for enhancing productivity and
yield. This paper introduces a novel weakly supervised method, the Implicit Cross Domain …

3D Deep Learning has made tremendous progress recently and is being widely used in
various fields, such as medical imaging, robotics, and autonomous vehicle driving, to identify …

AI Deep learning methods have been recently applied to defect detection and metrology
tasks for buried structures. They process 3D X-ray scans and provide a non-destructive …

The 2D-3D metrology is a critical step for in-line inspection and off-line failure analysis. Due
to lack of relevant data and complexity of embedded components, identifying and …

As printed circuit boards (PCBs) continue to evolve in complexity and miniaturization, the
demand for robust and efficient inspection techniques has become paramount in ensuring …

Reinforcement learning has had many recent achievements and is becoming increasingly
more relevant in the scientific community. As such, this work uses quantum computing to find …