A review of bayesian methods in electronic design automation

Z Gao, DS Boning - arXiv preprint arXiv:2304.09723, 2023 - arxiv.org
The utilization of Bayesian methods has been widely acknowledged as a viable solution for
tackling various challenges in electronic integrated circuit (IC) design under stochastic …

Fast and efficient high-sigma yield analysis and optimization using kernel density estimation on a bayesian optimized failure rate model

DD Weller, M Hefenbrock, M Beigl… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
With ever-increasing transistor density in nanoscale-integrated circuits, the impact of
process variations on circuit performance and chip yield becomes dominant. To prevent …

Reversible Gating Architecture for Rare Failure Detection of Analog and Mixed-Signal Circuits

MS Shim, H Hu, P Li - 2021 58th ACM/IEEE Design Automation …, 2021 - ieeexplore.ieee.org
Due to the growing complexity and numerous manufacturing variation in safety-critical
analog and mixed-signal (AMS) circuit design, rare failure detection in the high-dimensional …

Learning Architectures and Algorithms for Collision Avoidance and Sensor Fusion

MS Shim - 2020 - oaktrust.library.tamu.edu
The deep learning, which is a machine learning method based on artificial neural networks,
enables cutting edge technologies such as autonomous driving, collision avoidance, activity …