Progress in ammonothermal crystal growth of Gallium Nitride from 2017–2023: Process, Defects and Devices

N Stoddard, S Pimputkar - Crystals, 2023 - mdpi.com
Gallium nitride continues to be a material of intense interest for the ongoing advancement of
electronic and optoelectronic devices. While the bulk of today's markets for low-performance …

Research Progress in Liquid Phase Growth of GaN Crystals

D Sun, L Liu, G Wang, J Yu, Q Li, G Tian… - … A European Journal, 2024 - Wiley Online Library
As a wide band gap semiconductor, gallium nitride (GaN) has high breakdown voltage,
excellent structural stability and mechanical properties, giving it unique advantages in …

Reverse leakage mechanism of dislocation-free GaN vertical pn diodes

W Kwon, S Kawasaki, H Watanabe… - IEEE Electron …, 2023 - ieeexplore.ieee.org
The reverse leakage mechanism of threading dislocation (TD)-free gallium nitride (GaN)
vertical pn diode was investigated in various temperature range, and it was compared with …

Improved midgap recombination lifetimes in GaN crystals grown by the low-pressure acidic ammonothermal method

K Shima, K Kurimoto, Q Bao, Y Mikawa, M Saito… - Applied Physics …, 2024 - pubs.aip.org
To investigate the carrier recombination processes in GaN crystals grown by the low-
pressure acidic ammonothermal (LPAAT) method, the photoluminescence (PL) spectra and …

Temperature Field, Flow Field, and Temporal Fluctuations Thereof in Ammonothermal Growth of Bulk GaN—Transition from Dissolution Stage to Growth Stage …

S Schimmel, D Tomida, T Ishiguro, Y Honda… - Materials, 2023 - mdpi.com
With the ammonothermal method, one of the most promising technologies for scalable, cost-
effective production of bulk single crystals of the wide bandgap semiconductor GaN is …

Monitoring of GaN crystal growth rate in the Na flux growth via electroresistometry of Ga-Na solution

R Tandryo, K Itozawa, K Murakami, H Kubo… - Journal of Crystal …, 2023 - Elsevier
Monitoring the GaN crystal growth process in the Na-flux method has been difficult due to
the challenging growth process, namely high temperature and high pressure and corrosive …

Reducing GaN crystal dislocations through lateral growth on uneven seed crystal surfaces using the Na-flux method

S Washida, M Imanishi, R Tandryo… - Japanese Journal of …, 2023 - iopscience.iop.org
In recent years, we have achieved low threading dislocation density in GaN wafers by using
the Na-flux multi-point seed technique. However, the resulting wafers exhibit regions of high …

[HTML][HTML] Impacts of vacancy complexes on the room-temperature photoluminescence lifetimes of state-of-the-art GaN substrates, epitaxial layers, and Mg-implanted …

SF Chichibu, K Shima, A Uedono, S Ishibashi… - Journal of Applied …, 2024 - pubs.aip.org
For rooting the development of GaN-based optoelectronic devices, understanding the roles
of midgap recombination centers (MGRCs), namely, nonradiative recombination centers and …

[PDF][PDF] 我国高端压力容器设计制造与维护技术进展

陈学东, 范志超, 陈永东, 徐双庆, 崔军, 章小浒… - 机械工程 …, 2023 - qikan.cmes.org
压力容器是量大面广, 具有潜在泄漏和爆炸危险的承压类特种设备, 国家将其列为高端装备,
要求提升产品质量与核心竞争力. 21 世纪初以来, 我国压力容器行业科技工作者在极端压力容器 …

[HTML][HTML] Hydrostatic Pressure as a Tool for the Study of Semiconductor Properties—An Example of III–V Nitrides

I Gorczyca, T Suski, P Perlin, I Grzegory, A Kaminska… - Materials, 2024 - mdpi.com
Using the example of III–V nitrides crystallizing in a wurtzite structure (GaN, AlN, and InN),
this review presents the special role of hydrostatic pressure in studying semiconductor …