A state of the art on ADC modelling

P Arpaia, P Daponte, S Rapuano - Computer Standards & Interfaces, 2004 - Elsevier
The state of the art of the research on modelling of analog-to-digital converter (ADC)-based
measuring devices is surveyed. Main topics of modelling are reviewed according to the …

Exploiting pipeline ADC properties for a reduced-code linearity test technique

A Laraba, HG Stratigopoulos, S Mir… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
Testing the static performances of high-resolution analog-to-digital converters (ADCs)
consumes long test times that are disproportionately high with respect to the test time …

Par-BF: A parallel partitioned Bloom filter for dynamic data sets

Y Liu, X Ge, DHC Du, X Huang - The International Journal of …, 2016 - journals.sagepub.com
Compared with a hash table, a Bloom filter (BF) is more space efficient for supporting fast
matching through a controllable and acceptable false positive probability. The space size of …

Full information from measured ADC test data using maximum likelihood estimation

L Balogh, I Kollár, L Michaeli, J Šaliga, J Lipták - Measurement, 2012 - Elsevier
ADC testing is often done using sine wave excitation (see eg IEEE standard 1241). A sine
wave is fitted to the measured data in least squares sense, and the residuals are analyzed …

Modeling analog to digital converters at radio frequency

N Björsell - 2007 - diva-portal.org
This work considers behavior modeling of analog to digital converters with applications in
the radio frequency range, including the field of telecommunication as well as test and …

Word error rate measurement uncertainty estimation in digitizing waveform recorders

E Balestrieri, M Catelani, L Ciani, S Rapuano… - Measurement, 2013 - Elsevier
The paper proposes a method to measure the Word Error Rate (WER) affecting digitizing
waveform recorders, suitable to be included, as addendum, into the IEEE Std. 1057. In …

Processing of bidirectional exponential stimulus in ADC testing

J Šaliga, L Michaeli, M Sakmár, J Buša - Measurement, 2010 - Elsevier
ADC histogram test methods with exponential stimulus are ADC test methods alternative to
sine wave testing. Exponential stimulus test methods published until now were based on …

On-chip implementation of an integrator-based servo-loop for ADC static linearity test

G Renaud, MJ Barragan, S Mir… - 2014 IEEE 23rd Asian …, 2014 - ieeexplore.ieee.org
Linearity testing for ADCs is one of the most resource and time consuming tasks in the
production test of a mixed-signal integrated system. Advanced strategies for reducing static …

[PDF][PDF] Exponential fit test-theoretical analysis and practically implementation

J Vedral - 13th Workshop on ADC Modelling and Testing, 2008 - imeko.org
ADC testing by means of exponential signal is presented in the article. Time and frequency
analysis of the signal is performed and Signal-to-Noise Ratio and Effective Number of Bits is …

Noise sensitivity of the exponential histogram ADC test

J Šaliga, L Michaeli, R Holcer - Measurement, 2006 - Elsevier
This paper deals with some error effects caused by additive noise at analogue-to-digital
converters (ADCs) testing based on the histogram method and the exponential shape of …