The reliability of wire bonding using Ag and Al

M Schneider-Ramelow, C Ehrhardt - Microelectronics Reliability, 2016 - Elsevier
The combination of aluminum (Al) and silver (Ag) for wire bonding is long established:
aluminum (Al) heavy wire bonding on silver (Ag) metallization, such as pastes consisting of …

Advances in wire bonding technology for different bonding wire material

I Qin, A Shah, H Xu, B Chylak… - International …, 2015 - meridian.allenpress.com
With all the advances in 2.5 D and 3D packaging, wire bonding is still the most popular
interconnect technology and the workhorse of the industry. Wire bonding technology has …

ANN based RUL assessment for copper-aluminum wirebonds subjected to harsh environments

P Lall, S Deshpande, L Nguyen - 2016 IEEE International …, 2016 - ieeexplore.ieee.org
Copper (Cu) wire bonding is new alternative to traditional Gold (Au) wirebonds. Since Cu is
not as inert as Au, material selection in the package plays key role in reliability of packages …

Reliability model of LED package regarding the fatigue behavior of gold wires

P Altieri-Weimar, W Yuan, ES Annibale… - … and Multi-Physics …, 2016 - ieeexplore.ieee.org
In this study the mechanical properties and fatigue behavior of ultra-fine gold wires are
investigated by experimental tension fatigue tests and finite element (FE) simulation …

Principal Components Regression Model for Prediction of Acceleration Factors for Copper-Aluminum Wirebonds Subjected to Harsh Environments

P Lall, S Deshpande, L Nguyen - 2016 IEEE 66th Electronic …, 2016 - ieeexplore.ieee.org
Migration to Cu wirebond from traditional gold wirebond is recent trend in packaging
industry. Selection of different materials, such as EMC used in the molding process plays …

Wire bonding looping solutions for high density system-in-package (SiP)

B Milton, O Kwon, C Huynh, I Qin… - International …, 2017 - meridian.allenpress.com
Abstract System-in-Package (SiP) have seen a lot of growth in recent years especially in
mobile devices due to its higher level of system integration, more design flexibility and …

Bond pad effects on the shear strength of copper wire bonds

S Manoharan, S Hunter… - 2017 IEEE 19th …, 2017 - ieeexplore.ieee.org
Wire bond evaluation is crucial in determining its quality. With the increase in use of copper
wire bonds, this becomes even more important due to its nature to induce defects such as …

Development of advanced wire bonding technology for QFN devices

H Xu, A Rezvani, J Brunner, J Foley… - 2015 IEEE 65th …, 2015 - ieeexplore.ieee.org
Quad Flat No-Lead (QFN) is one of the fastest growing semiconductor packages. It offers a
variety of advantages including near-chip scale footprint, reduced lead inductance, thin …

[PDF][PDF] 基于ATE 的集成电路交流参数测试方法

孙莉莉, 李楠 - 电子与封装, 2017 - ep.org.cn
当前集成电路设计和制造方面的发展速度很快, 集成电路规模和水平不断提高,
也促进了相应的测试技术的发展. 集成电路交流参数的准确性已经成为影响集成电路性能的重要 …

[PDF][PDF] 三维封装中的并行键合线信号仿真分析

王祺翔, 曹立强, 周云燕 - 电子与封装, 2017 - ep.org.cn
当今便携式设备的速率可达数吉比特每秒, 但是其通道的频宽限制其性能. 在所有芯片与基板的
传输结构中键合线是最常用的, 但却渐渐成为了带宽主要的限制. 基于一款高密度布线系统级 …