Reprint of: Nanocalorimetry: Door opened for in situ material characterization under extreme non-equilibrium conditions

Y Gao, B Zhao, JJ Vlassak, C Schick - Progress in Materials Science, 2021 - Elsevier
The past two decades have witnessed the rapid development of nanocalorimetry, a novel
materials characterization technique that employs micromachined calorimetric sensors. The …

Quasi-in-situ observation on diffusion anisotropy dominated asymmetrical growth of Cu-Sn IMCs under temperature gradient

Y Qiao, H Ma, F Yu, N Zhao - Acta Materialia, 2021 - Elsevier
Quasi-in-situ method was carried out to observe the growth behavior of intermetallic
compounds (IMCs) in Cu/Sn-3.0 Ag-0.5 Cu/Cu micro solder joints with single β-Sn grain …

The phenomenon of tin pest: A review

B Cornelius, S Treivish, Y Rosenthal, M Pecht - Microelectronics Reliability, 2017 - Elsevier
The phenomenon of tin pest has been known for hundreds of years. Tin is one of the most
common materials used in electronic products and systems. It is found in solders, as a …

Supercooling suppression of metal-based microencapsulated phase change material (MEPCM) for thermal energy storage

K Lei, J Bao, X Zhao, H Wang, D Zou - Chemical Engineering Journal, 2022 - Elsevier
Due to the advantages of high thermal conductivity, high heat storage density per unit
volume and large specific surface area, metal-based microencapsulated phase change …

Effects of cobalt on the nucleation and grain refinement of Sn-3Ag-0.5 Cu solders

ZL Ma, SA Belyakov, CM Gourlay - Journal of Alloys and Compounds, 2016 - Elsevier
We show that cobalt-microalloying causes significant grain refinement in large samples (60
g) of Sn-3Ag-0.5 Cu solder. Nucleation occurs on the (100) facet of αCoSn 3 crystals with a …

Nucleation of tin on the Cu6Sn5 layer in electronic interconnections

JW Xian, ZL Ma, SA Belyakov, M Ollivier, CM Gourlay - Acta Materialia, 2017 - Elsevier
A Cu 6 Sn 5 layer is an integral part of many electronic interconnections. Here we show that,
although primary Cu 6 Sn 5 is not a potent nucleant for Sn, the Cu 6 Sn 5 layer plays a key …

[HTML][HTML] A metal-based microencapsulated phase change material (MEPCM) with high thermal reliability and its performance regulation

K Lei, S Wang, Z Wang, H Wang, D Zou - Composites Part A: Applied …, 2023 - Elsevier
An ideal microencapsulated phase change material (MEPCM) should have the
characteristics of high thermal reliability, low supercooling degree and high thermal …

Ag3Sn Morphology Transitions During Eutectic Growth in Sn–Ag Alloys

N Hou, JW Xian, A Sugiyama, H Yasuda… - … Materials Transactions A, 2023 - Springer
Abstract Eutectic Ag3Sn can grow with a variety of morphologies depending on the
solidification conditions and plays an important role in the performance of Pb-free solders …

Hypo-eutectic microstructure formation and nanomechanical response in Sn-3.0 Ag-0.5 Cu solder balls: effects of undercooling

B Wang, XJ Hu, W Sun, JL Liao, HL Peng, N Hou… - Materials …, 2023 - Elsevier
The microstructure control and refinement in length scale are pursued in the development of
next generations of Pb-free solder alloys with high reliability in harsh environments. In the …

Nucleation and twinning in tin droplet solidification on single crystal intermetallic compounds

ZL Ma, JW Xian, SA Belyakov, CM Gourlay - Acta Materialia, 2018 - Elsevier
Abstract βSn nucleation is a key step in the formation of microstructure in electronic solder
joints. Here, the heterogeneous nucleation of βSn is studied in undercooled tin droplets …