Recent advances and trends in advanced packaging

JH Lau - IEEE Transactions on Components, Packaging and …, 2022 - ieeexplore.ieee.org
In this study, advanced packaging is defined. The kinds of advanced packaging are ranked
based on their interconnect density and electrical performance, and are grouped into 2-D …

[HTML][HTML] Challenges and recent prospectives of 3D heterogeneous integration

S Zhang, Z Li, H Zhou, R Li, S Wang, KW Paik… - E-Prime-Advances in …, 2022 - Elsevier
With the continuous reduction of chip feature size, the continuation of Moore's Law becomes
increasingly difficult and heterogeneous integration has become one of the important …

Recent advances and trends in multiple system and heterogeneous integration with TSV-less interposers

JH Lau - IEEE Transactions on Components, Packaging and …, 2022 - ieeexplore.ieee.org
In this study, the recent advances and trends in multiple system and heterogeneous
integration with through-silicon via (TSV)-less interposer (organic interposer or 2.3-D IC …

Recent advances and trends in fan-out wafer/panel-level packaging

JH Lau - Journal of Electronic Packaging, 2019 - asmedigitalcollection.asme.org
The recent advances and trends in fan-out wafer/panel-level packaging (FOW/PLP) are
presented in this study. Emphasis is placed on:(A) the package formations such as (a) chip …

Die embedding challenges for EMIB advanced packaging technology

G Duan, Y Kanaoka, R McRee, B Nie… - 2021 IEEE 71st …, 2021 - ieeexplore.ieee.org
Intel's Embedded Multi-die Interconnect Bridge (EMIB) technology is an advanced, cost-
effective approach to in-package high density interconnects of heterogeneous chips …

Fan-out wafer-level packaging for heterogeneous integration

JH Lau, M Li, ML Qingqian, T Chen, I Xu… - IEEE Transactions …, 2018 - ieeexplore.ieee.org
The design, materials, process, fabrication, and reliability of a heterogeneous integration of
four chips and four capacitors by a fan-out wafer-level packaging (FOWLP) method are …

State of the art of lead-free solder joint reliability

JH Lau - Journal of Electronic Packaging, 2021 - asmedigitalcollection.asme.org
The state of the art of lead-free solder joint reliability is investigated in this study. Emphasis is
placed on the design for reliability (DFR) and reliability testing and data analysis. For …

Chip-first fan-out panel-level packaging for heterogeneous integration

CT Ko, H Yang, JH Lau, M Li, M Li, C Lin… - IEEE Transactions …, 2018 - ieeexplore.ieee.org
The design, materials, process, fabrication, and reliability of a heterogeneous integration of
four chips by a fan-out panel-level packaging (FOPLP) method are investigated in this …

Warpage measurements and characterizations of fan-out wafer-level packaging with large chips and multiple redistributed layers

JH Lau, M Li, L Yang, M Li, I Xu, T Chen… - IEEE Transactions …, 2018 - ieeexplore.ieee.org
In this paper, the warpages of a chip-first and die face-up fan-out wafer-level packaging
(FOWLP) with a very large silicon chip (10 mm× 10 mm× 0.15 mm) and three redistributed …

Comparison of mechanical modeling to warpage estimation of RDL-first fan-out panel-level packaging

CC Lee, CW Wang, CY Chen - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
To meet the requirements of low cost, thin vehicles, and multiple functions, the fan-out panel-
level packaging (FO-PLP) is introduced to be one of the next-generation packaging …