[图书][B] Analog VLSI design automation
The explosive growth and development of the integrated circuit market over the last few
years have been mostly limited to the digital VLSI domain. The difficulty of automating the …
years have been mostly limited to the digital VLSI domain. The difficulty of automating the …
[HTML][HTML] 基于CiteSpace 的故障预测知识结构与热点迁徙研究
周涵婷， 程龙生， 乔佩蕊， 宫粲然， 彭宅铭 - 控制与决策, 2022 - kzyjc.alljournals.cn
故障预测研究因应用对象广泛, 技术理论先进和实用价值高而备受关注. 基于此, 从“文献追踪”
视角, 挖掘故障预测的知识结构, 分布脉络和研究热点, 这是对故障预测综述类研究的一个新尝试 …
视角, 挖掘故障预测的知识结构, 分布脉络和研究热点, 这是对故障预测综述类研究的一个新尝试 …
Design for testability strategies for mixed signal & analogue designs-from layout to system
A Richardson, A Lechner… - 1998 IEEE International …, 1998 - ieeexplore.ieee.org
The cost and complexity of mixed signal and analogue production test programs is lending
to considerable interest in Design for testability (DfT) techniques that have the potential to …
to considerable interest in Design for testability (DfT) techniques that have the potential to …
[PDF][PDF] Modelling methods for testability analysis of analog integrated circuits based on pole-zero analysis
H Albustani - 2006 - duepublico2.uni-due.de
Analog and mixed-signal circuits are gaining popularity in various applications such as
telecommunication, multimedia, biomedical applications and others. Testing of these circuits …
telecommunication, multimedia, biomedical applications and others. Testing of these circuits …
Time-efficient fault detection and diagnosis system for analog circuits
Sažetak Time-efficient fault analysis and diagnosis of analog circuits are the most important
prerequisites to achieve online health monitoring of electronic equipments, which are …
prerequisites to achieve online health monitoring of electronic equipments, which are …
Generation of optimised fault lists for simulation of analogue circuits and test programs
A Milne, D Taylor, J Saunders, AD Talbot - IEE Proceedings-Circuits, Devices …, 1999 - IET
The definition of a universally acceptable analogue fault model has been a major obstacle to
the acceptance, by industry, of any of the new test and testability techniques that have been …
the acceptance, by industry, of any of the new test and testability techniques that have been …
Méthodologie d'estimation des métriques de test appliquée à une nouvelle technique de BIST de convertisseur SIGMA/DELTA
M Dubois - 2011 - theses.hal.science
L'expansion du marché des semi-conducteurs dans tous les secteurs d'activité résulte de la
capacité de créer de nouvelles applications grâce à l'intégration de plus en plus de …
capacité de créer de nouvelles applications grâce à l'intégration de plus en plus de …
模拟电路在线故障检测与诊断的FPGA 实现
罗旗舞， 何怡刚， 李中群， 郑剑， 于文新 - 计算机工程, 2013 - cqvip.com
选择节点电压, 幅频特性和相频特性构成故障特征向量集, 并根据多通道宽带数据采集接口和
驱动程序, 给出全数字式的正交幅相特性实时检测方法. 利用网络分析与信息融合技术 …
驱动程序, 给出全数字式的正交幅相特性实时检测方法. 利用网络分析与信息融合技术 …
A test design method for floating gate defects (FGD) in analog integrated circuits
M Pronath, H Graeb, K Antreich - Proceedings 2002 Design …, 2002 - ieeexplore.ieee.org
A unified approach to fault simulation for FGDs is introduced. Instead of a direct fault
simulation, the proposed approach calculates indirectly from the simulator output the sets of …
simulation, the proposed approach calculates indirectly from the simulator output the sets of …
Analog circuit degradation location method based on multi-point matching voting
J Shi, Y Wang, Y Hou - 2021 Global Reliability and Prognostics …, 2021 - ieeexplore.ieee.org
The wide application of analog circuits makes the health assessment of analog circuits more
and more important. The purpose of analog circuit health assessment is to find the …
and more important. The purpose of analog circuit health assessment is to find the …