Structure and properties of Sn-Cu lead-free solders in electronics packaging

M Zhao, L Zhang, ZQ Liu, MY Xiong… - Science and technology …, 2019 - Taylor & Francis
With the development of lead-free solders in electronic packaging, Sn-Cu lead-free solder
has attracted wide attention due to its excellent comprehensive performance and low cost. In …

Critical properties of Cu6Sn5 in electronic devices: Recent progress and a review

DK Mu, SD McDonald, J Read, H Huang… - Current Opinion in Solid …, 2016 - Elsevier
As the most common of the intermetallic compounds (IMCs) formed between Sn-based
solders and Cu substrates during the packaging of integrated circuits (ICs), Cu 6 Sn 5 is …

[HTML][HTML] Nucleation and growth of Ag3Sn in Sn-Ag and Sn-Ag-Cu solder alloys

Y Cui, JW Xian, A Zois, K Marquardt, H Yasuda… - Acta Materialia, 2023 - Elsevier
Abstract Large Ag 3 Sn plates in solder joints can affect the reliability of electronics,
however, the factors affecting their nucleation and morphology are not well understood …

Cu6Sn5 crystal growth mechanisms during solidification of electronic interconnections

JW Xian, SA Belyakov, M Ollivier, K Nogita, H Yasuda… - Acta Materialia, 2017 - Elsevier
The growth mechanisms of primary Cu 6 Sn 5 are studied in Sn-Cu alloys and solder joints
by combining EBSD, FIB-tomography and synchrotron radiography. With increasing cooling …

Effect of Ni doping on elastic properties, fracture toughness, electronic properties, and thermal conductivity of η'-Cu6Sn5 in Sn-Cu solder: A first-principles calculation

S Xu, A Yang, Y Duan, M Li, M Peng - Materials Today Communications, 2023 - Elsevier
The phase stability, elastic properties, fracture toughness, electronic structure and thermal
conductivity of Ni-doped η'-Cu 6 Sn 5 have been obtained using first-principles calculations …

Nucleation of tin on the Cu6Sn5 layer in electronic interconnections

JW Xian, ZL Ma, SA Belyakov, M Ollivier, CM Gourlay - Acta Materialia, 2017 - Elsevier
A Cu 6 Sn 5 layer is an integral part of many electronic interconnections. Here we show that,
although primary Cu 6 Sn 5 is not a potent nucleant for Sn, the Cu 6 Sn 5 layer plays a key …

Nucleation and twinning in tin droplet solidification on single crystal intermetallic compounds

ZL Ma, JW Xian, SA Belyakov, CM Gourlay - Acta Materialia, 2018 - Elsevier
Abstract βSn nucleation is a key step in the formation of microstructure in electronic solder
joints. Here, the heterogeneous nucleation of βSn is studied in undercooled tin droplets …

Extremely fast formation of CuSn intermetallic compounds in Cu/Sn/Cu system via a micro-resistance spot welding process

B Liu, Y Tian, C Wang, R An, Y Liu - Journal of Alloys and Compounds, 2016 - Elsevier
High-temperature-stable circuit interconnects are highly desirable for the wide band-gap
semiconductor devices to operate in harsh environment (> 200° C). In this study, a full Cu 3 …

Interfacial reaction, wettability, and shear strength of ultrasonic-assisted lead-free solder joints prepared using Cu–GNSs-doped flux

Z Gui, X Hu, X Jiang, Y Li, H Wang - Journal of Materials Science: Materials …, 2021 - Springer
This paper aims to investigate the influence of composite flux on the interfacial reaction,
wettability, and shear strength evolution of Sn-3.0 Ag-0.5 Cu (SAC305) solder joint; the …

Effect of Ni on the Formation and Growth of Primary Cu6Sn5 Intermetallics in Sn-0.7 wt.%Cu Solder Pastes on Cu Substrates During the Soldering Process

MAA Mohd Salleh, SD McDonald, CM Gourlay… - Journal of Electronic …, 2016 - Springer
This paper investigates the effect of 0.05 wt.% Ni on the formation and growth of primary Cu
6 Sn 5 in Sn-0.7 wt.% Cu solder paste soldered on a Cu substrate, using a real-time …