The electronic and optical properties of Al 2 O 3/SiO 2 dielectric thin films grown on Si (1 0 0)
by the atomic layer deposition method were studied by means of x-ray photoelectron …

A reverse Monte Carlo (RMC) method is developed to obtain the energy loss function (ELF)
and optical constants from a measured reflection electron energy-loss spectroscopy …

The dispersion (van der Waals and Casimir) force between two semi-spaces is calculated
using Lifshitz theory for different materials relevant for micro-and nanodevices fabrication …

The energy loss functions (ELFs) and optical constants of Si and SiO 2 were obtained from
quantitative analysis of reflection electron energy loss spectroscopy (REELS) by a new …

Electronic and optical properties of (La2O3) x (Al2O3) 1− x thin films grown on Si (100) by
the atomic layer deposition method were studied by means of reflection electron energy loss …

The characterization of nanomaterials with complex three-dimensional (3D) geometries is
required to further research and enable the continuing development of nanotechnology. In …

The article presents the irradiation effects of low energy (∼ 0.5 keV) inert gaseous Argon ion
beams on optical constants [real (n) and imaginary (k) parts of the refractive index], dielectric …

Abstract The ZnO-NiO-SiO2 nanocomposites were prepared using transition metal oxides by
sol-gel method. The surface morphology of the prepared samples was investigated by …

We have investigated the chemical states and the band gap of ultrathin Si oxynitrides on Si
(100) by X‐ray photoemission spectroscopy (XPS) and reflection electron energy loss …

The electronic and optical properties of a-Al 2 O 3 after induced by 3-keV Ar+ sputtering
have been studied quantitatively by use of reflection electron energy loss spectroscopy …