Chemical–mechanical polishing of 4H silicon carbide wafers
Abstract 4H silicon carbide (4H‐SiC) holds great promise for high‐power and high‐
frequency electronics, in which high‐quality 4H‐SiC wafers with both global and local …
frequency electronics, in which high‐quality 4H‐SiC wafers with both global and local …
Selective doping in silicon carbide power devices
Silicon carbide (SiC) is the most mature wide band-gap semiconductor and is currently
employed for the fabrication of high-efficiency power electronic devices, such as diodes and …
employed for the fabrication of high-efficiency power electronic devices, such as diodes and …
Ion implantation doping in silicon carbide and gallium nitride electronic devices
Wide band gap semiconductors such as silicon carbide (SiC) and gallium nitride (GaN) are
excellent materials for the next generation of high-power and high-frequency electronic …
excellent materials for the next generation of high-power and high-frequency electronic …
Exploring crystal recovery and dopant activation in coated laser annealing on ion implanted 4H–SiC epitaxial layers
In this work an extensive characterization over XeCl multishot laser irradiation was
performed at different energy densities and with different thicknesses of graphitic coating …
performed at different energy densities and with different thicknesses of graphitic coating …
Laser annealing of P and Al implanted 4H-SiC epitaxial layers
This work describes the development of a new method for ion implantation induced crystal
damage recovery using multiple XeCl (308 nm) laser pulses with a duration of 30 ns …
damage recovery using multiple XeCl (308 nm) laser pulses with a duration of 30 ns …
Pulsed Laser Annealing of Phosphorous-Implanted 4H-SiC: Electrical and Structural Characteristics
J Wu, Z He, Z Guo, R Tian, F Wang, M Liu… - Journal of Electronic …, 2022 - Springer
Pulsed laser annealing (PLA, 527 nm, 200-ns pulse, Nd: YLF laser) was used to activate
phosphorous-implanted C-face SiC and repair lattice damage. The electrical and structural …
phosphorous-implanted C-face SiC and repair lattice damage. The electrical and structural …
Analysis of the electrical activation data in thermally annealed implanted Al/4H–SiC systems: A novel approach based on cooperativity
V Boldrini, A Parisini, M Pieruccini - Materials Science in Semiconductor …, 2022 - Elsevier
The dependence on the annealing temperature, T ann, of the Al asymptotic substitutional
fraction φ∞ in implanted silicon carbide (4H–SiC), is addressed from a statistical …
fraction φ∞ in implanted silicon carbide (4H–SiC), is addressed from a statistical …
Graphite Assisted P and Al Implanted 4H-SiC Laser Annealing
This paper discusses a novel annealing technique for 4H-SiC implants which involves the
use of pulsed XeCl laser (l= 308 nm). In particular, an absorbing graphitic coating is used to …
use of pulsed XeCl laser (l= 308 nm). In particular, an absorbing graphitic coating is used to …
Simulation of the effects of postimplantation annealing on silicon carbide DMOSFET characteristics
Technological control of doped regions is exceptionally important for all semiconductor
devices. For the wide bandgap semiconductor silicon carbide, the activation state of dopants …
devices. For the wide bandgap semiconductor silicon carbide, the activation state of dopants …
Font Side Solutions for c-Si Solar Cells with High-Temperature Passivating Contacts
E Genç - 2024 - infoscience.epfl.ch
In this work, we studied the potential of using thin films deposited by plasma-enhanced
chemical vapor deposition (PECVD) for two main purposes: introducing an n-type …
chemical vapor deposition (PECVD) for two main purposes: introducing an n-type …