Chemical–mechanical polishing of 4H silicon carbide wafers

W Wang, X Lu, X Wu, Y Zhang, R Wang… - Advanced Materials …, 2023 - Wiley Online Library
Abstract 4H silicon carbide (4H‐SiC) holds great promise for high‐power and high‐
frequency electronics, in which high‐quality 4H‐SiC wafers with both global and local …

Selective doping in silicon carbide power devices

F Roccaforte, P Fiorenza, M Vivona, G Greco… - Materials, 2021 - mdpi.com
Silicon carbide (SiC) is the most mature wide band-gap semiconductor and is currently
employed for the fabrication of high-efficiency power electronic devices, such as diodes and …

Ion implantation doping in silicon carbide and gallium nitride electronic devices

F Roccaforte, F Giannazzo, G Greco - Micro, 2022 - mdpi.com
Wide band gap semiconductors such as silicon carbide (SiC) and gallium nitride (GaN) are
excellent materials for the next generation of high-power and high-frequency electronic …

Exploring crystal recovery and dopant activation in coated laser annealing on ion implanted 4H–SiC epitaxial layers

C Calabretta, A Pecora, M Agati, A Muoio… - Materials Science in …, 2024 - Elsevier
In this work an extensive characterization over XeCl multishot laser irradiation was
performed at different energy densities and with different thicknesses of graphitic coating …

Laser annealing of P and Al implanted 4H-SiC epitaxial layers

C Calabretta, M Agati, M Zimbone, S Boninelli… - Materials, 2019 - mdpi.com
This work describes the development of a new method for ion implantation induced crystal
damage recovery using multiple XeCl (308 nm) laser pulses with a duration of 30 ns …

Pulsed Laser Annealing of Phosphorous-Implanted 4H-SiC: Electrical and Structural Characteristics

J Wu, Z He, Z Guo, R Tian, F Wang, M Liu… - Journal of Electronic …, 2022 - Springer
Pulsed laser annealing (PLA, 527 nm, 200-ns pulse, Nd: YLF laser) was used to activate
phosphorous-implanted C-face SiC and repair lattice damage. The electrical and structural …

Analysis of the electrical activation data in thermally annealed implanted Al/4H–SiC systems: A novel approach based on cooperativity

V Boldrini, A Parisini, M Pieruccini - Materials Science in Semiconductor …, 2022 - Elsevier
The dependence on the annealing temperature, T ann, of the Al asymptotic substitutional
fraction φ∞ in implanted silicon carbide (4H–SiC), is addressed from a statistical …

Graphite Assisted P and Al Implanted 4H-SiC Laser Annealing

C Calabretta, A Pecora, M Agati, S Privitera… - Materials Science …, 2022 - Trans Tech Publ
This paper discusses a novel annealing technique for 4H-SiC implants which involves the
use of pulsed XeCl laser (l= 308 nm). In particular, an absorbing graphitic coating is used to …

Simulation of the effects of postimplantation annealing on silicon carbide DMOSFET characteristics

A Toifl, V Šimonka, A Hössinger… - … on Electron Devices, 2019 - ieeexplore.ieee.org
Technological control of doped regions is exceptionally important for all semiconductor
devices. For the wide bandgap semiconductor silicon carbide, the activation state of dopants …

Font Side Solutions for c-Si Solar Cells with High-Temperature Passivating Contacts

E Genç - 2024 - infoscience.epfl.ch
In this work, we studied the potential of using thin films deposited by plasma-enhanced
chemical vapor deposition (PECVD) for two main purposes: introducing an n-type …