Conspectus In this Account, we describe the challenges and promising applications of
transmission electron microscopy (TEM) imaging and spectroscopy at cryogenic …

The metal-oxide-semiconductor (MOS) capacitor is one of the fundamental electrical
components used in integrated circuits. While much effort is currently being made to …

Local electromagnetic fields in a specimen is measured at high spatial resolutions using
differential phase contrast (DPC) imaging in scanning transmission electron microscopy …

Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in
microscopy to help readers understand the propagation of electrons from the source to the …

Nanoelectronic devices play an essential role in many domains, and their development and
improvement attract considerable attention in fundamental and applied research. Access to …

The one-dimensional charge density distribution along an electrically biased Fe atom probe
needle is measured using a model-independent approach based on off-axis electron …

Electron holography is a powerful technique that allows the phase shift of a high-energy
electron wave that has passed through a specimen in the transmission electron microscope …

While electron holography in the transmission electron microscope offers the possibility to
measure maps of the electrostatic potential of semiconductors down to nanometer …

Off-axis electron holography is a powerful technique for recording the phase shift of high-
energy electron waves that pass through a thin specimen in the transmission electron …

Quantitative materials characterization using electron holography frequently requires
knowledge of the mean inner potential, but reported experimental mean inner potential …