Comparative study of oxygen-and carbon-related defects in electron irradiated cz–Si doped with isovalent impurities

CA Londos, A Chroneos, EN Sgourou, I Panagiotidis… - Applied Sciences, 2022 - mdpi.com
Crystalline silicon (Si) is the key material of the semiconductor industry, with significant
applications for electronic and microelectronic devices. The properties of Si are affected by …

[HTML][HTML] Defect characterization studies on irradiated boron-doped silicon pad diodes and Low Gain Avalanche Detectors

A Himmerlich, N Castello-Mor, EC Rivera… - Nuclear Instruments and …, 2023 - Elsevier
High-energy physics detectors with internal charge multiplication, like Low Gain Avalanche
Detectors (LGADs), that will be used for fast timing in the High Luminosity LHC experiments …

[图书][B] Silicon, germanium, and their alloys: growth, defects, impurities, and nanocrystals

G Kissinger, S Pizzini - 2014 - books.google.com
Despite the vast knowledge accumulated on silicon, germanium, and their alloys, these
materials still demand research, eminently in view of the improvement of knowledge on …

Electronic and dynamical properties of the silicon trivacancy

J Coutinho, VP Markevich, AR Peaker, B Hamilton… - Physical Review B …, 2012 - APS
The trivacancy (V 3) in silicon has been recently shown to be a bistable center in the neutral
charge state, with a fourfold-coordinated configuration, V 3 [FFC], lower in energy than the …

Radiation damage in n-type silicon diodes after electron irradiation with energies between 1.5 MeV and 15 MeV

R Radu, E Fretwurst, R Klanner, G Lindstroem… - Nuclear Instruments and …, 2013 - Elsevier
Radiation damage in silicon, caused by the creation of point and cluster defects due to
energetic charged hadrons and neutrons, results in a serious degradation of silicon-sensor …

Supercell-size convergence of formation energies and gap levels of vacancy complexes in crystalline silicon in density functional theory calculations

J Dabrowski, G Kissinger - Physical Review B, 2015 - APS
Results for supercell-size convergence of formation energies and charge transition levels of
vacancy complexes V n (1≤ n≤ 11) in crystalline Si are reported for the ab initio density …

First-principles investigation of the trivacancy capture cross-section in silicon

V Pelenitsyn, P Korotaev - Computational Materials Science, 2024 - Elsevier
The investigation of defect properties in silicon, including charge transition levels and non-
radiative carrier capture, has been ongoing for over 60 years. However, many questions still …

Donor levels of the divacancy-oxygen defect in silicon

VP Markevich, AR Peaker, B Hamilton… - Journal of Applied …, 2014 - pubs.aip.org
The elimination of divacancies (V 2) upon isochronal and isothermal annealing has been
studied in oxygen-rich p-type silicon by means of deep level transient spectroscopy (DLTS) …

Formation of a Bistable Interstitial Complex in Irradiated p‐Type Silicon

LF Makarenko, SB Lastovski… - … status solidi (a), 2019 - Wiley Online Library
The influence of the injection of minority charge carriers on the formation of a divalent
bistable defect (DBH) having two energy levels of Ev+ 0.44 eV and Ev+ 0.53 eV in its …

Transformation kinetics of an intrinsic bistable defect in damaged silicon

RM Fleming, CH Seager, DV Lang… - Journal of Applied …, 2012 - pubs.aip.org
The positions of the electronic levels of an intrinsic bistable defect have been measured
using deep level transient spectroscopy (DLTS) in n-and p-type damaged silicon bipolar …