The atomic force microscope (AFM) is not only a tool to image the topography of solid
surfaces at high resolution. It can also be used to measure force-versus-distance curves …

A few years after the invention of the scanning tunneling microscope (STM), the atomic force
microscope (AFM) was developed. 1 Instead of measuring tunneling current, a new physical …

This second edition of Handbook of Micro/Nanotribology addresses the rapid evolution
within this field, serving as a reference for the novice and the expert alike. Two parts divide …

As the size of electronic and mechanical devices shrinks to the nanometre regime,
performance begins to be dominated by surface forces. For example, friction, wear and …

We present a technique to measure the lateral stiffness of the nanometer-sized contact
formed between a friction force microscope tip and a sample surface. Since the lateral …

We have implemented a force modulation technique for nanoindentation using a three-plate
capacitive load-displacement transducer. The stiffness sensitivity of the instrument is∼ 0.1 …

In this article, we present a quantitative stiffness imaging technique and demonstrate its use
to directly map the dynamic mechanical properties of materials with nanometer-scale lateral …

During the past decade, the atomic force microscope (AFM) has become a key technique in
biochemistry and biophysics to characterize supported lipid films, as testified by the …

I developed a wideband low-noise optical beam deflection sensor with a photothermal
cantilever excitation system for liquid-environment atomic force microscopy. The developed …

Magnetic, acoustic, and thermal (Brownian motion induced) excitations are commonly used
for dynamic atomic force microscopy (AFM) in liquids, yet the fundamental differences in …