AlGaN/GaN high electron mobility transistor for various sensing applications: a review

AM Bhat, R Poonia, A Varghese, N Shafi… - Micro and …, 2023 - Elsevier
AlGaN/GaN high electron mobility transistors (HEMTs) demonstrate exceptional properties
desired for sensing regime applications due to their extraordinary chemical stability, non …

Nanotransistor-based gas sensing with record-high sensitivity enabled by electron trapping effect in nanoparticles

Q Hu, P Solomon, L Österlund, Z Zhang - Nature Communications, 2024 - nature.com
Highly sensitive, low-power, and chip-scale H 2 gas sensors are of great interest to both
academia and industry. Field-effect transistors (FETs) functionalized with Pd nanoparticles …

Fluorine Plasma Treatment for AlGaN/GaN HEMT-Based Ultraviolet Photodetector with High Responsivity and High Detectivity

K Zhou, L Shan, Y Zhang, D Lu, Y Ma… - IEEE Electron …, 2023 - ieeexplore.ieee.org
AlGaN/GaN high electron mobility transistor (HEMT) has attracted great attention in
ultraviolet photodetectors (UVPDs) due to the ultrahigh responsivity and high photocurrent …

Sensitivity analysis of Al0. 3Ga0. 7N/GaN dielectric modulated MOSHEMT biosensor

A Dastidar, TK Patra, SK Mohapatra… - ECS Journal of Solid …, 2023 - iopscience.iop.org
Emerging and newly proposed devices integrate various materials at different scales (from
nano to submicron), which reveals sensor response. Prefab simulation is in great demand to …

Unveiling the self-heating and process variation reliability of a junctionless FinFET-based hydrogen gas sensor

N Gandhi, S Rathore, RK Jaisawal… - IEEE Sensors …, 2023 - ieeexplore.ieee.org
Field-effect-transistor-based sensors are essential for environmental monitoring, industrial
analyte detection, medical diagnosis, etc. This letter unveiled the process variation, self …

Gate oxide induced reliability assessment of junctionless FinFET-based hydrogen gas sensor

N Gandhi, RK Jaisawal, S Rathore… - 2023 IEEE …, 2023 - ieeexplore.ieee.org
Gate oxide plays a crucial role in the performance of nano-scaled emerging devices. In FET-
based sensors, gate-oxide-induced reliability analysis is essential for credible sensing. In …

Nanoporous GaN on p-type GaN: A Mg out-diffusion compensation layer for heavily Mg-doped p-type GaN

KJ Lee, Y Nakazato, J Chun, X Wen, C Meng… - …, 2022 - iopscience.iop.org
Embedding p-type gallium nitride (p-GaN) with controlled Mg out-diffusion in adjacent
epitaxial layers is a key for designing various multi-junction structures with high precision …

Radiation-sensitive AlGaN/GaN MOS-HEMT-based dosimeter

R Mann, S Rewari, P Pal, S Sharma… - Journal of Electronic …, 2022 - Springer
Abstract An AlGaN/GaN MOS-HEMT (metal oxide semiconductor–high electron mobility
transistor)-based dosimeter has been proposed to demonstrate and evaluate the impact of …

GaN-HEMT on Si as a robust visible-blind UV detector with high responsivity

A Varghese, A Eblabla, Z Wu, SU Ghozati… - IEEE Sensors …, 2022 - ieeexplore.ieee.org
This work presents performance evaluation of GaN High Electron Mobility Transistor (HEMT)
based ultraviolet (UV) detector on Si substrate. In addition to the fabrication and …

Junctionfree gate stacked vertical TFET hydrogen sensor at room temperature

S Ghosh, L Rajan, A Varghese - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Presented through this work is an investigation of junctionfree gate-stacked (SiO 2+ high-k)
double gated vertical tunnel field-effect transistor (JF-GS-VTFET) with focus on its hydrogen …