The comparison of structural and electro-optical properties of (In, Yb) 2O3 thin films with...

The deep investigation of annealing temperature and gamma irradiation on Al2O3/Yb2O3/Al2O3/n-Si (100) MOS-like structure

A Mutale, MC Zulu, E Yilmaz - Journal of Materials Science: Materials in …, 2023 - Springer
In this paper, we report the fabrication of Al/Al2O3/Yb2O3/Al2O3/n-Si (100) charge trapping
memory device by RF magnetron sputtering technique. The structural and electrical …
被引用次数：2 相关文章 所有 3 个版本