Parasitic NPN and PNP latch-up within a single DMOS for high voltage reliability

E Coyne, S Geary, A Brannick… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
This article discusses the robustness of field-plate-assisted reduced surface field effect
(RESURF) DMOS designs to time-dependent latch-up within a single dielectrically isolated …

Measurement of RF linear operating area of bipolar transistors

Ž Osrečki, J Žilak, M Koričić… - Ieee microwave and …, 2020 - ieeexplore.ieee.org
The methodology for the measurement of the knee voltage and maximum collector current
for the linear operation of bipolar transistors is described and demonstrated on the …

The Effect of Collector Region Design on Large-Signal Performance of Horizontal Current Bipolar Transistor (HCBT)

F Bogdanović, Ž Osrečki, J Žilak… - IEEE transactions on …, 2023 - ieeexplore.ieee.org
The impact of collector region design on large-signal performance of horizontal current
bipolar transistor (HCBT) technology is investigated by calibrated time-domain load-pull …

Low Frequency Noise in advanced 55nm BiCMOS SiGeC Heterojunction Bipolar Transistors: impact of collector doping

B Sagnes, F Pascal, M Seif, A Hoffmann… - … on Noise and …, 2017 - ieeexplore.ieee.org
In this work we present the first Low Frequency Noise results obtained on the new 55 nm
BiCMOS technology developed by STMicroelectronics. With this improved technology at …

Study of HBT operation beyond breakdown voltage: Definition of a Safe Operating Area in this operation regime including the aging laws

M Jaoul - 2020 - theses.hal.science
The development of new BiCMOS technology will be possible, thanks to the SiGe: CHBTs
technological improvements to reach dynamic performance beyond 0.5 THz. Animportant …

Threshold current for the onset of kirk effect in bipolar transistors with a fully depleted nonuniformly doped collector

R van der Toorn - IEEE electron device letters, 2006 - ieeexplore.ieee.org
We derive a generalized expression for the threshold current of the Kirk effect (base
widening) in bipolar transistors that have a fully depleted collector and a nonuniform dopant …

Radiofrequency power amplifiers in horizontal current bipolar transistor technology

Ž Osrečki - 2021 - dr.nsk.hr
The large-signal performance of the horizontal current bipolar transistor (HCBT) is
investigated by extensive measurements and simulations, and its suitability for the …

An Initial study on The Reliability of Power Semiconductor Devices

BK Boksteen, RJE Hueting, C Salm… - 2010 STW. ICT …, 2010 - research.utwente.nl
An initial literature study combined with some basic comparative simulations has been
performed on different electricfield modulation techniques and the subsequent reliability …

Characteristics of Lateral Diffused Metal–Oxide–Semiconductor Transistors with Lightly Doped Drain Implantation through Gradual Screen Oxide

CR Yan, JF Chen, CY Lin, HT Hsu… - Japanese Journal of …, 2013 - iopscience.iop.org
Characteristics of lateral diffused metal–oxide–semiconductor (LDMOS) transistors with
gradual junction profile by self-alignment implant through dual thicknesses of screen oxide …

100Gbps Half-Rate Referenceless Injection-Locking Clock/Data Recovery Circuit in 0.18 µm BiCMOS Process

B Samavaty - 2017 - escholarship.org
The demand for bandwidth intensive applications has increased significantly in the last
decade. Applications such as video streaming, cloud-based computing, cloud storage and …