Adaptive Threshold Processing of Secondary Electron Images in Scanning Electron Microscope
W Bian, M Wang, Z Yang - … , ICIRA 2019, Shenyang, China, August 8–11 …, 2019 - Springer
Observing the sample under a scanning electron microscope (SEM) requires adjustment of
brightness and contrast to obtain a clear image. The traditional method is manually adjusted …
brightness and contrast to obtain a clear image. The traditional method is manually adjusted …