Design and simulation of junctionless nanowire tunnel field effect transistor for highly sensitive biosensor

P Kumar, B Raj - Microelectronics Journal, 2023 - Elsevier
This paper investigates symmetrical design of a Junctionless Nanowire Tunnel-Field-Effect-
Transistor (JL-NWTFET) for highly sensitive biosensor. JL-NWTFET deployed using Gate-All …

Effect of lateral straggle parameter on hetero junction dual gate vertical TFET

K Nasani, B Bhowmick, PD Pukhrambam - Microelectronics Journal, 2023 - Elsevier
In this Article, the effects of lateral straggle parameter variation and Temperature variation
have been investigated on Hetero Junction Dual Gate Vertical TFET. Although the TFET is a …

Investigation and optimization of electro-thermal performance of Double Gate-All-Around MOSFET

X Zhang, J Xu, Z Chen, Q Wang, W Liu, Q Li, W Bai… - Microelectronics …, 2022 - Elsevier
Abstract The Double Gate-All-Around (DGAA) MOSFET and GAA NWFET are compared and
analyzed from both electrical and thermal perspectives under four different conditions by …

A physics-based drain current model for Si1-xGex source/drain NT JLFET for enhanced hot carrier reliability with temperature measurement

A Thakur, R Dhiman - Microelectronics Journal, 2022 - Elsevier
In this paper, we report, the hot carrier reliability issue in the Si 1-x Ge x source/drain
nanotube (NT) junctionless field-effect transistor (JLFET) with temperature variations. The …

Fin core dimensionality and corner effect in dual core gate-all-around FinFET

PS Das, D Deb, R Goswami, S Sharma, R Saha - Microelectronics Journal, 2024 - Elsevier
This article proposes investigation of low power performance of a fin field-effect transistor
(FinFET) with surrounding gates through a calibrated technology computer-aided design …

An analytical model for P+ pocket SiC gate all around Junctionless field effect transistor with impact of high temperature

N Yarlagadda, YK Verma - Micro and Nanostructures, 2023 - Elsevier
In this article, we examined the influence of temperature in P+ pocket silicon carbide (SiC)
gate all around junctionless field effect transistor (GAA JLFET). The inclusion of P+ pocket …

A temperature dependent drain current model of P+ SiC GAA JLFETs for enhanced analog/RF performance

N Yarlagadda, YK Verma, G Amarnath - Micro and Nanostructures, 2024 - Elsevier
In this article, a mathematical model is presented for the drain current and electric field of
silicon carbide gate all around junctionless field effect transistors (SiC GAA JLFETs). The …

Analysis of subthreshold swing in junctionless cylindrical surrounding gate MOSFET using Gaussian doping profile

H Jung - International Journal of Advanced Technology and …, 2022 - search.proquest.com
The subthreshold swing (SS) model is presented for a junctionless cylindrical surrounding
gate (JLCSG) metal oxide semiconductor field effect transistor (MOSFET) with a Gaussian …

An analytical model of P+ SiC core-shell JLFETs to analyze the performance for higher breakdown voltages applications

Z Azam, A Kumar - Micro and Nanostructures, 2024 - Elsevier
In this article, we proposed a core-shell (CS) architecture that uses the silicon carbide (SiC)
as a nanowire for higher breakdown voltages in a Junctionless field effect transistor (JLFET) …