Recent advances in GaN‐based power HEMT devices
The ever‐increasing power density and operation frequency in electrical power conversion
systems require the development of power devices that can outperform conventional Si …
systems require the development of power devices that can outperform conventional Si …
Recent progress in group III-nitride nanostructures: From materials to applications
F Chen, X Ji, SP Lau - Materials Science and Engineering: R: Reports, 2020 - Elsevier
Group-III-nitride semiconductors, including AlN, GaN, InN and their ternary, quaternary
compounds, are promising electronic and optoelectronic materials for the applications in …
compounds, are promising electronic and optoelectronic materials for the applications in …
High-sensitivity and fast-speed UV photodetectors based on asymmetric nanoporous-GaN/graphene vertical junction
T Hu, L Zhao, Y Wang, H Lin, S Xie, Y Hu, C Liu… - ACS …, 2023 - ACS Publications
GaN-based photodetectors are strongly desirable in many advanced fields, such as space
communication, environmental monitoring, etc. However, the slow photo-response speed in …
communication, environmental monitoring, etc. However, the slow photo-response speed in …
Improved epitaxy of AlN film for deep‐ultraviolet light‐emitting diodes enabled by graphene
The growth of single‐crystal III‐nitride films with a low stress and dislocation density is
crucial for the semiconductor industry. In particular, AlN‐derived deep‐ultraviolet light …
crucial for the semiconductor industry. In particular, AlN‐derived deep‐ultraviolet light …
A review of gallium nitride power device and its applications in motor drive
X Ding, Y Zhou, J Cheng - CES Transactions on Electrical …, 2019 - ieeexplore.ieee.org
Wide band-gap gallium nitride (GaN) device has the advantages of large band-gap, high
electron mobility and low dielectric constant. Compared with traditional Si devices, these …
electron mobility and low dielectric constant. Compared with traditional Si devices, these …
Effect of substrate-induced strain on the structural, electrical, and optical properties of polycrystalline thin films
The effect of substrate-induced strain in polycrystalline ZnO thin films on different substrate,
eg, GaN epilayer, sapphire (0001), quartz glass, Si (111)∕ SiO 2, and glass deposited by …
eg, GaN epilayer, sapphire (0001), quartz glass, Si (111)∕ SiO 2, and glass deposited by …
[HTML][HTML] Development of GaN HEMTs fabricated on silicon, silicon-on-insulator, and engineered substrates and the heterogeneous integration
LH Hsu, YY Lai, PT Tu, C Langpoklakpam, YT Chang… - Micromachines, 2021 - mdpi.com
GaN HEMT has attracted a lot of attention in recent years owing to its wide applications from
the high-frequency power amplifier to the high voltage devices used in power electronic …
the high-frequency power amplifier to the high voltage devices used in power electronic …
Wafer‐Scale Transferrable GaN Enabled by Hexagonal Boron Nitride for Flexible Light‐Emitting Diode
L Wang, S Yang, F Zhou, Y Gao, Y Duo, R Chen… - Small, 2024 - Wiley Online Library
Epitaxy growth and mechanical transfer of high‐quality III‐nitrides using 2D materials,
weakly bonded by van der Waals force, becomes an important technology for semiconductor …
weakly bonded by van der Waals force, becomes an important technology for semiconductor …
Ultrathin-barrier AlGaN/GaN heterostructure: A recess-free technology for manufacturing high-performance GaN-on-Si power devices
(Al) GaN recess-free normally OFF technology is developed for fabrication of high-yield
lateral GaN-based power devices. The recess-free process is achieved by an ultrathin …
lateral GaN-based power devices. The recess-free process is achieved by an ultrathin …
[HTML][HTML] Layered transition metal dichalcogenides: promising near-lattice-matched substrates for GaN growth
Most III-nitride semiconductors are grown on non-lattice-matched substrates like sapphire or
silicon due to the extreme difficulty of obtaining a native GaN substrate. We show that …
silicon due to the extreme difficulty of obtaining a native GaN substrate. We show that …