Structural, electrical and optical properties of sputtered vanadium pentoxide thin films
M Benmoussa, E Ibnouelghazi, A Bennouna… - Thin solid films, 1995 - Elsevier
Thin films of vanadium pentoxide (V2O5) are prepared by rf sputtering from a V2O5 target in
a gas mixture of argon and oxygen under a total pressure Pt= P (O2)+ P (Ar)= 10− 2 mbar …
a gas mixture of argon and oxygen under a total pressure Pt= P (O2)+ P (Ar)= 10− 2 mbar …
Electrochromism in sputtered V2O5 thin films: structural and optical studies
M Benmoussa, A Outzourhit, A Bennouna… - Thin Solid Films, 2002 - Elsevier
Vanadium pentoxide thin films were successfully fabricated on indium–tin–oxide-coated
glasses by rf sputtering in an Ar/O2 gas mixture. The films gave excellent cyclic …
glasses by rf sputtering in an Ar/O2 gas mixture. The films gave excellent cyclic …
Study of ZnTe thin films deposited by rf sputtering
H Bellakhder, A Outzourhit, EL Ameziane - Thin Solid Films, 2001 - Elsevier
ZnTe thin films were prepared by cathodic rf-sputtering from a single high purity ZnTe target.
The deposition rate increases with sputtering power. The ZnTe films deposited at 50 W were …
The deposition rate increases with sputtering power. The ZnTe films deposited at 50 W were …
Optical characterization of low optical thickness thin films from transmittance and back reflectance measurements
In this work a method for the determination of the thickness and optical properties of low
optical thickness films (D< 600 nm), from the experimental transmittance (T) and back …
optical thickness films (D< 600 nm), from the experimental transmittance (T) and back …
Structural, Optical and Electrochromic Properties of Sol–Gel V2O5 Thin Films
M Benmouss, A Outzourhit, R Jourdani… - Active and passive …, 2003 - Wiley Online Library
Vanadium pentoxide thin films are prepared by the sol–gel route by dissolving V2O5 powder
(99.5% purity) in H2O2 solution. The solution is spin‐coated on glass substrates for optical …
(99.5% purity) in H2O2 solution. The solution is spin‐coated on glass substrates for optical …
Determination of thickness, refractive index, and thickness irregularity for semiconductor thin films from transmission spectra
A simplified theoretical model has been proposed to predict optical parameters such as
thickness, thickness irregularity, refractive index, and extinction coefficient from transmission …
thickness, thickness irregularity, refractive index, and extinction coefficient from transmission …
Pulsed laser deposition and electrodeposition techniques in growing CdTe and CdxHg1− xTe thin films
CdTe and CdxHg1− xTe (CMT) thin films were grown by a cathodic electrodeposition
technique Also CdTe was deposited using a Pulsed Laser Deposition (PLD) technique …
technique Also CdTe was deposited using a Pulsed Laser Deposition (PLD) technique …
Reflection spectrum for a thin film with non-uniform thickness
T Pisarkiewicz - Journal of Physics D: Applied Physics, 1994 - iopscience.iop.org
The analytical expression for the reflectance of a weakly absorbing wedge shaped thin film
supported on a thick transparent substrate has been obtained. The envelopes of reflectance …
supported on a thick transparent substrate has been obtained. The envelopes of reflectance …
[PDF][PDF] Determination of optical properties of undoped amorphous selenium (a-Se) films by dielectric modeling of their normal-incidence transmittance spectra
MH Saleh, MMAG Jafar, BN Bulos… - Applied Physics …, 2014 - researchgate.net
Normal-incidence specular transmittance of undoped amorphous selenium (a-Se) films of
several thicknesses (0.25 1 μm) thermally evaporated on thick microscopic glass-slide …
several thicknesses (0.25 1 μm) thermally evaporated on thick microscopic glass-slide …
Some structural and optical properties of CdS thin films prepared by RF sputtering
K El Assali, M Boustani, A Khiara… - … status solidi (a), 2000 - Wiley Online Library
Stable CdS thin films were prepared by radio frequency sputtering onto glass substrates
from a CdS target (purity 4N). The as‐grown films were thermally annealed under vacuum at …
from a CdS target (purity 4N). The as‐grown films were thermally annealed under vacuum at …