A new method for the hermeticity testing of wafer-level packaging

D Lellouchi, J Dhennin, X Lafontan… - Journal of …, 2010 - iopscience.iop.org
Until now, the determination of microelectronic packages hermeticity has been related to the
MIL-STD-883 method 1014 which is based on the helium leak detection method. But this …

Vacuum quality evaluation for uncooled micro bolometer thermal imager sensors

M Elßner - Microelectronics Reliability, 2014 - Elsevier
This paper presents an innovative and effective method of measuring the internal vacuum
quality of un-cooled micro bolometer thermal imager sensors where the bolometer sensor …

Vacuum-controlled wafer-level packaging for micromechanical devices

SJ Kang, YS Moon, WH Son… - Japanese Journal of …, 2014 - iopscience.iop.org
A vacuum-controlled wafer-level packaging process for micromechanical devices was
developed. The process includes a thick titanium deposition process and a vacuum anodic …

On the determination of Poisson's ratio of stressed monolayer and bilayer submicron thick films

P Martins, C Malhaire, S Brida, D Barbier - Microsystem technologies, 2009 - Springer
In this paper, the bulge test is used to determine the mechanical properties of very thin
dielectric membranes. Commonly, this experimental method permits to determine the …

[PDF][PDF] Vacuum in microsystems–generation and measurement

T Grzebyk, P Stasiak, A Gorecka-Drzazga - Optica Applicata, 2011 - researchgate.net
This paper reviews the current state of art of vacuum encapsulation of microsystems.
Different types of bonding techniques and “integrated sealing process” are described. It is …

Silicon on insulator temperature and pressure sensor for MEMS smart packaging

E Lefeuvre, E Martincic, M Woytasik, X Leroux… - Procedia …, 2009 - Elsevier
This paper presents hermetic packaging for MEMS with integrated temperature and
pressure sensors based on Silicon On Insulator technology. Temperature and pressure are …

Interference microscopy techniques for microsystem characterization

A Bosseboeuf, P Coste… - Optical Inspection of …, 2019 - taylorfrancis.com
Since the 1990s, optical profilers based on interference microscopy techniques are the most
widely used characterization tools for fast and high-resolution three-dimensional topography …

Holographic microscopy of phase and diffuse objects under the influence of laser radiation, magnetic fields, hyperbary

LV Tanin, AL Tanin, LV Tanin, AL Tanin - Biomedical and Resonance …, 2021 - Springer
The first works on the development of the directions of biomedical optics in Belarus were
studied by LV Tanin in 1975. Soon the urgency of this direction became clear, and due to …

[PDF][PDF] Approche alternative de l'évaluation de l'hermiticité des micro cavités. Application au packaging des MEMS

D Veyrié - 2007 - theses.hal.science
L 'encapsulation fait partie intégrante du processus de fabrication des circuits
microélectroniques. Son rôle est de protéger le composant vis-à-vis de son environnement …

TEM analysis of microheater using SiO2/Si3N4 composite membrane for long term gas sensing applications

P Chowdhury, S Roy - 2017 1st International Conference on …, 2017 - ieeexplore.ieee.org
In this paper, simulation result of MEMS based micro-hotplate using the finite element
method (FEM) has been presented. FEM subdivides a large problem into smaller, simpler …