Efficient nonlinear algorithm for envelope detection in white light interferometry

KG Larkin - JOSA A, 1996 - opg.optica.org
A compact and efficient algorithm for digital envelope detection in white light interferograms
is derived from a well-known phase-shifting algorithm. The performance of the new …

Surface profiling by analysis of white-light interferograms in the spatial frequency domain

P De Groot, L Deck - Journal of modern optics, 1995 - Taylor & Francis
We describe a scanning white-light interferometer for high-precision surface structure
analysis. Interferograms for each of the image points in the field of view of the instrument are …

[图书][B] Optical inspection of Microsystems

W Osten, A Duparre, C Furlong, I De Wolf, A Asundi… - 2018 - taylorfrancis.com
Where conventional testing and inspection techniques fail at the micro-scale, optical
techniques provide a fast, robust, and relatively inexpensive alternative for investigating the …

Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry

P Sandoz, R Devillers, A Plata - Journal of modern optics, 1997 - Taylor & Francis
This paper proposes a white-light phase-shifting method for interferometry, in which the
absolute phase of each point is measured individually. During the axial scanning of the …

An algorithm for profilometry by white-light phase-shifting interferometry

P Sandoz - Journal of modern optics, 1996 - Taylor & Francis
In the case of white-light interferometry, the usual phase shifting methods cannot be used
because the modulation in the interference intensity is due to both the phase variation and to …

Dispersion error in white-light Linnik interferometers and its implications for evaluation procedures

A Pförtner, J Schwider - Applied optics, 2001 - opg.optica.org
White-light interferometry is a standard optical tool with which to measure profiles of
discontinuous structures such as diffractive optical elements. But there is one outstanding …

High-resolution profilometry by using phase calculation algorithms for spectroscopic analysis of white-light interferograms

P Sandoz, G Tribillon, H Perrin - Journal of Modern Optics, 1996 - Taylor & Francis
The proposed profilometer is based on an optical spectral analysis of white-light
interferograms. Phase calculation algorithms are applied within the spectral domain for high …

White-light scanning fiber Michelson interferometer for absolute position–distance measurement

T Li, A Wang, K Murphy, R Claus - Optics letters, 1995 - opg.optica.org
A white-light fiber interferometer working in the spatial domain, using two fiber ends in a
hollow tube as the sensing head and an electric magnetic actuator–mirror reflector as the …

Evaluation of spectral phase in spectrally resolved white-light interferometry: Comparative study of single-frame techniques

SK Debnath, MP Kothiyal, SW Kim - Optics and Lasers in Engineering, 2009 - Elsevier
Spectral phase in a white-light interferogram contains information about the absolute optical
path difference (OPD) in the interferometer. Evaluation of spectral phase is therefore …

Accurate measurements of droplet volume with coherence scanning interferometry

Z Zhang, J Chen, H Yang, Z Yin - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Accurate volume measurement of droplets in inkjet printed organic light-emitting diode
(OLED) is important to achieve defect-free manufacturing. Although coherence scanning …