摘要第四代同步辐射光源为多个研究领域提供了亮度和相干度更高, 性能更加优异的X 射线.
为了充分发挥这些光束的潜力, 需要精确的光束线装调和高质量的X 射线光学元件 …

Speckle-based at-wavelength metrology techniques now play an important role in X-ray
wavefront measurements. However, for reflective X-ray optics, the majority of existing …

A metrology device based on the near-field speckle technique was developed in the x-ray
test beamline at the Shanghai Synchrotron Radiation Facility to meet the at-wavelength …

At-wavelength metrology of X-ray optics plays a crucial role in evaluating the performance of
optics under actual beamline operating conditions, enabling in situ diagnostics and …

摘要为了支撑高性能光源波前调控与先进实验技术开发, 并在工作波长下实现实验室级面形测量
, 搭建了微焦点X 射线光栅干涉仪实验平台. X 射线光栅干涉仪是一种具有极高灵敏度的波前传 …

摘要基于同步辐射和自由电子激光装置的X 射线纳米聚焦技术已经成为开展前沿科学与技术
研究的重要利器. 鉴于X 射线波段纳米聚焦材料的折射率都接近于1, 故X 射线聚焦元件与传统 …

A speckle-based method for the X-ray crystal diffraction wavefront measurement is
implemented, and the slope errors of channel-cut crystals with different surface …