Combined synchrotron X-ray and image-correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton

S Djaziri, PO Renault, F Hild, E Le Bourhis… - Journal of Applied …, 2011 - journals.iucr.org
In situ biaxial tensile tests within the elastic domain were conducted with W/Cu
nanocomposite thin films deposited on a polyimide cruciform substrate using a biaxial …

Elastic anisotropy of polycrystalline Au films: Modeling and respective contributions of X-ray diffraction, nanoindentation and Brillouin light scattering

D Faurie, P Djémia, E Le Bourhis, PO Renault… - Acta Materialia, 2010 - Elsevier
Elastic properties of non-textured and {111}-fiber-textured gold thin films were investigated
experimentally by several complementary techniques, namely in situ tensile testing under X …

In situ diffraction strain analysis of elastically deformed polycrystalline thin films, and micromechanical interpretation

D Faurie, O Castelnau, R Brenner… - Journal of Applied …, 2009 - journals.iucr.org
In situ tensile tests have been carried out under synchrotron radiation on supported gold
(Au) thin films exhibiting a pronounced crystallographic texture. The 2θ shift of X-ray …

Strains in light-ion-implanted polycrystals: influence of grain orientation

A Richard, H Palancher, E Castelier… - Journal of Applied …, 2012 - scripts.iucr.org
The implantation of He ions in UO2 polycrystals induces a strain in the implanted layer
which can be characterized using Laue micro X-ray diffraction (µ-XRD). The strain tensor …

Extremely anisotropic, direction-dependent elastic grain interaction: The case of ultrathin films

U Welzel, A Kumar, EJ Mittemeijer - Applied Physics Letters, 2009 - pubs.aip.org
The elastic grain interaction in a 50-nm-thick Pd thin film sputter deposited on a single-
crystalline Si substrate has been investigated employing x-ray diffraction residual stress …

Benefits of two-dimensional detectors for synchrotron X-ray diffraction studies of thin film mechanical behavior

G Geandier, PO Renault, S Teat… - Journal of Applied …, 2008 - journals.iucr.org
Performing a complete in situ mechanical property analysis of polycrystalline thin films using
X-ray diffraction is time consuming with most standard diffraction beamlines at synchrotron …

Controlled biaxial deformation of nanostructured W/Cu thin films studied by X-ray diffraction

S Djaziri, D Thiaudière, G Geandier, PO Renault… - Surface and Coatings …, 2010 - Elsevier
The deformation behaviour of 150nm thick W/Cu nanocomposite deposited on polyimide
substrates has been analysed under equi-biaxial tensile testing coupled to X-ray diffraction …

Conductance and persistent current in quasi-one-dimensional systems with grain boundaries: Effects of the strongly reflecting and columnar grains

J Feilhauer, M Moško - Physical Review B—Condensed Matter and Materials …, 2011 - APS
We study mesoscopic transport in the quasi-one-dimensional wires and rings made of a two-
dimensional conductor of width W and length L≫ W. Our aim is to compare an impurity-free …

Characterization and modelling of the elastic properties of nano-structured W/Cu multilayers

O Castelnau, G Geandier, PO Renault, P Goudeau… - Thin Solid Films, 2007 - Elsevier
Understanding the mechanical behavior of nano-structured thin films in relation to their
microstructure, in particular to the grain size, is of utmost importance for the development of …

Deposition of ultra-thin gold film on in situ loaded polymeric substrate for compression tests

PO Renault, D Faurie, E Le Bourhis, G Geandier… - Materials Letters, 2012 - Elsevier
An original experimental approach is presented to test under compression ultra-thin films on
compliant substrates. The sputtering chamber was modified to permit deposition of the film …