Noise spectroscopy of molecular electronic junctions
Y Kim, H Song - Applied Physics Reviews, 2021 - pubs.aip.org
Over the past few decades, the field of molecular electronics has greatly benefited from
advances in the fundamental understanding of charge transport mechanisms. Molecular …
advances in the fundamental understanding of charge transport mechanisms. Molecular …
Random Telegraph Signal: a local probe for single point defect studies in solid-state devices
E Simoen, C Claeys - Materials Science and Engineering: B, 2002 - Elsevier
This paper provides an overview on Random Telegraph Signals (RTSs) in solid-state
devices and more in particular in scaled silicon MOSFETs. It tries to answer the following …
devices and more in particular in scaled silicon MOSFETs. It tries to answer the following …
Modeling of electron conduction in contact resistive random access memory devices as random telegraph noise
YH Tseng, WC Shen, CJ Lin - Journal of Applied Physics, 2012 - pubs.aip.org
The intense development and study of resistive random access memory (RRAM) devices
has opened a new era in semiconductor memory manufacturing. Resistive switching and …
has opened a new era in semiconductor memory manufacturing. Resistive switching and …
[图书][B] Strain-engineered mosfets
CK Maiti, TK Maiti - 2012 - library.oapen.org
This book brings together new developments in the area of strain-engineered MOSFETs
using high-mibility substrates such as SIGe, strained-Si, germanium-on-insulator and III-V …
using high-mibility substrates such as SIGe, strained-Si, germanium-on-insulator and III-V …
Liquid-gated two-layer silicon nanowire FETs: Evidence of controlling single-trap dynamic processes
Y Kutovyi, I Zadorozhnyi, V Handziuk, H Hlukhova… - Nano …, 2018 - ACS Publications
We fabricate two-layer (TL) silicon nanowires (NW) field-effect transistors (FETs) with a liquid
gate. The NW devices show advanced characteristics, which reflect reliable single-electron …
gate. The NW devices show advanced characteristics, which reflect reliable single-electron …
Threshold voltage fluctuation by random telegraph noise in floating gate NAND flash memory string
Read current fluctuation (ΔI read) due to random telegraph noise was measured from a cell
in a NAND flash memory cell string, and its effect on threshold voltage fluctuation (ΔV th) …
in a NAND flash memory cell string, and its effect on threshold voltage fluctuation (ΔV th) …
Low-frequency noise assessment for deep submicrometer CMOS technology nodes
This overview focuses on the different types of noise occurring in deep submicrometer
silicon metal oxide semiconductor field-effect transistors and their use as an analytical tool …
silicon metal oxide semiconductor field-effect transistors and their use as an analytical tool …
Correlated charge detection for readout of a solid-state quantum computer
TM Buehler, DJ Reilly, R Brenner, AR Hamilton… - Applied physics …, 2003 - pubs.aip.org
The single-electron transistor (SET) is a prime candidate for reading out the final state of a
qubit in a solid-state quantum computer. Such a measurement requires the detection of …
qubit in a solid-state quantum computer. Such a measurement requires the detection of …
Trapped charge dynamics in InAs nanowires
GW Holloway, Y Song, CM Haapamaki… - Journal of Applied …, 2013 - pubs.aip.org
We study random telegraph noise in the conductance of InAs nanowire field-effect
transistors due to single electron trapping in defects. The electron capture and emission …
transistors due to single electron trapping in defects. The electron capture and emission …
Low-frequency noise in deep-submicron metal–oxide–semiconductor field-effect transistors
Z Celik-Butler - IEE Proceedings-Circuits, Devices and Systems, 2002 - IET
The author reviews the recent results obtained on the low-frequency noise characteristics of
deep-submicron metal–oxide–semiconductor field-effect transistors (MOSFETs). The …
deep-submicron metal–oxide–semiconductor field-effect transistors (MOSFETs). The …