Characterisation of negative-U defects in semiconductors
J Coutinho, VP Markevich… - Journal of Physics …, 2020 - iopscience.iop.org
This review aims at providing a retrospective, as well as a description of the state-of-the-art
and future prospects regarding the theoretical and experimental characterisation of negative …
and future prospects regarding the theoretical and experimental characterisation of negative …
[HTML][HTML] Identification of the mechanism responsible for the boron oxygen light induced degradation in silicon photovoltaic cells
M Vaqueiro-Contreras, VP Markevich… - Journal of Applied …, 2019 - pubs.aip.org
Silicon solar cells containing boron and oxygen are one of the most rapidly growing forms of
electricity generation. However, they suffer from significant degradation during the initial …
electricity generation. However, they suffer from significant degradation during the initial …
Boron–oxygen complex responsible for light‐induced degradation in silicon photovoltaic cells: A new insight into the problem
VP Markevich, M Vaqueiro-Contreras… - … status solidi (a), 2019 - Wiley Online Library
Results available in the literature on minority carrier trapping and light‐induced degradation
(LID) effects in silicon materials containing boron and oxygen atoms are briefly reviewed …
(LID) effects in silicon materials containing boron and oxygen atoms are briefly reviewed …
Bistability of the BiOi complex and its implications on evaluating the “acceptor removal” process in p-type silicon
The dependencies of the B i O i defect concentration on doping, irradiation fluence and
particle type in p-type silicon diodes have been investigated. We evidenced that large data …
particle type in p-type silicon diodes have been investigated. We evidenced that large data …
First-principles investigation of the trivacancy capture cross-section in silicon
V Pelenitsyn, P Korotaev - Computational Materials Science, 2024 - Elsevier
The investigation of defect properties in silicon, including charge transition levels and non-
radiative carrier capture, has been ongoing for over 60 years. However, many questions still …
radiative carrier capture, has been ongoing for over 60 years. However, many questions still …
Effect of oxygen-related defects on the performance of seed-end wafers in Ga-doped recharged Czochralski silicon: Thermal donors
J Huang, R Wu, H Zhang, C Wang, D Hu, S Yuan… - Journal of Crystal …, 2024 - Elsevier
Ga-doped recharged Czochralski silicon (Ga-RCZ) is now becoming mainstream in the
current photovoltaic market because of the enhanced production efficiency and reduced …
current photovoltaic market because of the enhanced production efficiency and reduced …
Photoluminescence spectroscopy of thermal donors and oxygen precipitates formed in czochralski silicon at 450° C
Photoluminescence spectra have been measured at 80 K in Czochralski-grown silicon
wafers annealed at 450° C, causing thermal donor and oxygen-precipitate generation. Six …
wafers annealed at 450° C, causing thermal donor and oxygen-precipitate generation. Six …
Oxygen impurity in crystalline silicon
G Kissinger - Handbook of Photovoltaic Silicon, 2019 - Springer
Oxygen belongs to the most important impurities in many types of solar silicon. Interstitial
oxygen is already incorporated in a supersaturated state during crystal growth. Subsequent …
oxygen is already incorporated in a supersaturated state during crystal growth. Subsequent …
Photoconductance determination of carrier capture cross sections of slow traps in silicon through variable pulse filling
The capture cross sections are a key metric to characterize carrier traps in semiconductors.
In this article, photoconductance measurements are used to estimate the capture cross …
In this article, photoconductance measurements are used to estimate the capture cross …
Defect luminescence from thermal donors in silicon: impact of dopant type and thermal donor concentration
M Siriwardhana, FE Rougieux… - 2020 47th IEEE …, 2020 - ieeexplore.ieee.org
Low-temperature photoluminescence spectroscopy is applied to investigate the difference in
luminescence spectra in phosphorous doped and boron doped Cz-Si wafers with different …
luminescence spectra in phosphorous doped and boron doped Cz-Si wafers with different …