This comprehensive review covers the latest published activities using XRF techniques. X-
ray analytical equipment continues to be integrated with X-ray emission/diffraction …

Total reflection X-ray photoelectron spectroscopy (TRXPS) is applied in the analysis of Ti
and TiO 2 nanolayers deposited on silicon and silicon dioxide substrates. The idea of …

The grazing emission X-ray fluorescence (GEXRF) technique was applied to the analysis of
different Al films, with nominal thicknesses in the range of 1 nm to 150 nm, on Si wafers. In …

Photon-in-photon-out core level spectroscopy is an emerging approach to characterize the
electronic structure of catalysts and enzymes, and it is either installed or planned for intense …

In this work two synchrotron radiation-based depth-sensitive X-ray fluorescence techniques,
grazing incidence X-ray fluorescence (GIXRF) and grazing emission X-ray fluorescence …

Grazing emission X-ray fluorescence (GEXRF) is well suited for nondestructive elemental-
sensitive depth-profiling measurements on samples with nanometer-sized features. By …

Grazing incidence and grazing emission X-ray fluorescence spectroscopy (GI/GE-XRF) are
techniques that enable nondestructive, quantitative analysis of elemental depth profiles with …

Controlled synthesis of nanostructure ultrathin films is critical for applications in
nanoelectronics, photonics, and energy generation and storage. The paucity of structural …

Various 3-dimensional nano-scaled periodic structures with different configurations and
periods deposited on the surface of silicon and silica substrates were investigated by means …

Nanoparticles are considered for applications in domains as various as medical and
pharmaceutical sciences, opto-and microelectronics, catalysis, photovoltaics, spintronics or …