A review of switching slew rate control for silicon carbide devices using active gate drivers

S Zhao, X Zhao, Y Wei, Y Zhao… - IEEE Journal of …, 2020 - ieeexplore.ieee.org
Driving solutions for power semiconductor devices are experiencing new challenges since
the emerging wide bandgap power devices, such as silicon carbide (SiC), with superior …

An overview about Si, Superjunction, SiC and GaN power MOSFET technologies in power electronics applications

EO Prado, PC Bolsi, HC Sartori, JR Pinheiro - Energies, 2022 - mdpi.com
This work presents a comparative analysis among four power MOSFET technologies:
conventional Silicon (Si), Superjunction (SJ), Silicon Carbide (SiC) and Gallium Nitride …

Analytical Switching Loss Modeling Based on Datasheet Parameters for mosfets in a Half-Bridge

D Christen, J Biela - IEEE Transactions on Power Electronics, 2018 - ieeexplore.ieee.org
Modern wide-bandgap devices, such as SiC-or GaN-based devices, feature significantly
reduced switching losses, and the question arises if soft-switching operating modes are still …

Evaluation and application of 600 V GaN HEMT in cascode structure

X Huang, Z Liu, Q Li, FC Lee - IEEE Transactions on Power …, 2013 - ieeexplore.ieee.org
Gallium nitride high electron mobility transistor (GaN HEMT) has matured dramatically over
the last few years. A progressively larger number of GaN devices have been manufactured …

Characterization and experimental assessment of the effects of parasitic elements on the MOSFET switching performance

J Wang, HS Chung, RT Li - IEEE Transactions on Power …, 2012 - ieeexplore.ieee.org
This paper presents a comprehensive study on the influences of parasitic elements on the
MOSFET switching performance. A circuit-level analytical model that takes MOSFET …

Predicting SiC MOSFET behavior under hard-switching, soft-switching, and false turn-on conditions

MR Ahmed, R Todd, AJ Forsyth - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
Circuit-level analytical models for hard-switching, soft-switching, and-induced false turn on
of SiC MOSFETs and their experimental validation are described. The models include the …

Analytical loss model of high voltage GaN HEMT in cascode configuration

X Huang, Q Li, Z Liu, FC Lee - IEEE Transactions on Power …, 2013 - ieeexplore.ieee.org
This paper presents an accurate analytical model to calculate the power loss of a high
voltage Gallium Nitride high electron mobility transistor (GaN HEMT) in cascode …

Package parasitic inductance extraction and simulation model development for the high-voltage cascode GaN HEMT

Z Liu, X Huang, FC Lee, Q Li - IEEE Transactions on Power …, 2013 - ieeexplore.ieee.org
This paper presents the development of a simulation model for high-voltage gallium nitride
(GaN) high-electron-mobility transistors (HEMT) in a cascode structure. A method is …

Comparison of a buck converter and a series capacitor buck converter for high-frequency, high-conversion-ratio voltage regulators

PS Shenoy, M Amaro, J Morroni… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
This paper presents an analytical and experimental comparison of a two-phase buck
converter and a two-phase, series capacitor buck converter. The limitations of a …

New physical insights on power MOSFET switching losses

Y Xiong, S Sun, H Jia, P Shea… - IEEE transactions on …, 2009 - ieeexplore.ieee.org
Realistic estimation of power MOSFET switching losses is critical for predicting the maximum
junction temperature and efficiency of power electronics circuits. The purpose of this paper is …