Effects of carbon on the electrical and optical properties of InN, GaN, and AlN

JL Lyons, A Janotti, CG Van de Walle - Physical Review B, 2014 - APS
Carbon is a common impurity in the group-III nitrides, often unintentionally incorporated
during growth. Nevertheless, the properties of carbon impurities in the nitrides are still not …

[HTML][HTML] A first-principles study of carbon-related energy levels in GaN. I. Complexes formed by substitutional/interstitial carbons and gallium/nitrogen vacancies

M Matsubara, E Bellotti - Journal of Applied Physics, 2017 - pubs.aip.org
Various forms of carbon based complexes in GaN are studied with first-principles
calculations employing Heyd-Scuseria-Ernzerhof hybrid functionals within the framework of …

Migration mechanisms and diffusion barriers of carbon and native point defects in GaN

A Kyrtsos, M Matsubara, E Bellotti - Physical Review B, 2016 - APS
Carbon related defects are readily incorporated in GaN due to its abundance during growth
both with MBE and MOCVD techniques. Employing first-principles calculations, we compute …

[HTML][HTML] A first-principles study of carbon-related energy levels in GaN. II. Complexes formed by carbon and hydrogen, silicon or oxygen

M Matsubara, E Bellotti - Journal of Applied Physics, 2017 - pubs.aip.org
This work presents an in-depth investigation of the properties of complexes composed of
hydrogen, silicon, or oxygen with carbon, which are the major unintentional impurities in …

Carbon in GaN: Calculations with an optimized hybrid functional

P Deák, M Lorke, B Aradi, T Frauenheim - Physical Review B, 2019 - APS
GaN is of great importance for optoelectronic and power electronic devices, and carbon is
one of its most common impurities, used also actively for preparing semi-insulating buffer …

Determination of carbon-related trap energy level in (Al) GaN buffers for high electron mobility transistors through a room-temperature approach

X Chen, Y Zhong, Y Zhou, H Gao, X Zhan, S Su… - Applied Physics …, 2020 - pubs.aip.org
A room-temperature method to determine the trap energy levels in the carbon-doped (Al)
GaN buffers is developed via a transient current measurement on the AlGaN/GaN high …

Tuned and screened range-separated hybrid density functional theory for describing electronic and optical properties of defective gallium nitride

DK Lewis, A Ramasubramaniam, S Sharifzadeh - Physical Review Materials, 2020 - APS
We apply a hybrid density functional theory approach, based on a tuned and screened
range-separated hybrid (SRSH) exchange-correlation functional, to describe the …

Bulk photovoltaic effect in carbon-doped gallium nitride revealed by anomalous surface photovoltage spectroscopy

I Levine, I Gamov, M Rusu, K Irmscher, C Merschjann… - Physical Review B, 2020 - APS
A bulk photovoltaic effect was observed in insulating carbon-doped gallium nitride crystals
by investigating the light-induced change of the contact potential difference with a Kelvin …

Effects of negative bias stress on trapping properties of AlGaN/GaN Schottky barrier diodes

P Ferrandis, M Charles, C Gillot, R Escoffier… - Microelectronic …, 2017 - Elsevier
Power diodes or transistors must be able to work in high voltage/high current use, for
instance in AC/DC converters. However, in such aggressive conditions trapping effects can …

Defect Behavior on the Degradation of AlGaN-Based 234 nm LEDs

M Li, M Su, Z Chen, S Deng, X Zhu… - … on Electron Devices, 2023 - ieeexplore.ieee.org
In this article, the degradation of 234 nm AlGaN-based far-UVC light-emitting diodes (LEDs)
under constant current stress is studied in-depth by the combination of optical and electrical …