Effects of carbon on the electrical and optical properties of InN, GaN, and AlN
Carbon is a common impurity in the group-III nitrides, often unintentionally incorporated
during growth. Nevertheless, the properties of carbon impurities in the nitrides are still not …
during growth. Nevertheless, the properties of carbon impurities in the nitrides are still not …
[HTML][HTML] A first-principles study of carbon-related energy levels in GaN. I. Complexes formed by substitutional/interstitial carbons and gallium/nitrogen vacancies
M Matsubara, E Bellotti - Journal of Applied Physics, 2017 - pubs.aip.org
Various forms of carbon based complexes in GaN are studied with first-principles
calculations employing Heyd-Scuseria-Ernzerhof hybrid functionals within the framework of …
calculations employing Heyd-Scuseria-Ernzerhof hybrid functionals within the framework of …
Migration mechanisms and diffusion barriers of carbon and native point defects in GaN
Carbon related defects are readily incorporated in GaN due to its abundance during growth
both with MBE and MOCVD techniques. Employing first-principles calculations, we compute …
both with MBE and MOCVD techniques. Employing first-principles calculations, we compute …
[HTML][HTML] A first-principles study of carbon-related energy levels in GaN. II. Complexes formed by carbon and hydrogen, silicon or oxygen
M Matsubara, E Bellotti - Journal of Applied Physics, 2017 - pubs.aip.org
This work presents an in-depth investigation of the properties of complexes composed of
hydrogen, silicon, or oxygen with carbon, which are the major unintentional impurities in …
hydrogen, silicon, or oxygen with carbon, which are the major unintentional impurities in …
Carbon in GaN: Calculations with an optimized hybrid functional
GaN is of great importance for optoelectronic and power electronic devices, and carbon is
one of its most common impurities, used also actively for preparing semi-insulating buffer …
one of its most common impurities, used also actively for preparing semi-insulating buffer …
Determination of carbon-related trap energy level in (Al) GaN buffers for high electron mobility transistors through a room-temperature approach
X Chen, Y Zhong, Y Zhou, H Gao, X Zhan, S Su… - Applied Physics …, 2020 - pubs.aip.org
A room-temperature method to determine the trap energy levels in the carbon-doped (Al)
GaN buffers is developed via a transient current measurement on the AlGaN/GaN high …
GaN buffers is developed via a transient current measurement on the AlGaN/GaN high …
Tuned and screened range-separated hybrid density functional theory for describing electronic and optical properties of defective gallium nitride
We apply a hybrid density functional theory approach, based on a tuned and screened
range-separated hybrid (SRSH) exchange-correlation functional, to describe the …
range-separated hybrid (SRSH) exchange-correlation functional, to describe the …
Bulk photovoltaic effect in carbon-doped gallium nitride revealed by anomalous surface photovoltage spectroscopy
A bulk photovoltaic effect was observed in insulating carbon-doped gallium nitride crystals
by investigating the light-induced change of the contact potential difference with a Kelvin …
by investigating the light-induced change of the contact potential difference with a Kelvin …
Effects of negative bias stress on trapping properties of AlGaN/GaN Schottky barrier diodes
P Ferrandis, M Charles, C Gillot, R Escoffier… - Microelectronic …, 2017 - Elsevier
Power diodes or transistors must be able to work in high voltage/high current use, for
instance in AC/DC converters. However, in such aggressive conditions trapping effects can …
instance in AC/DC converters. However, in such aggressive conditions trapping effects can …
Defect Behavior on the Degradation of AlGaN-Based 234 nm LEDs
M Li, M Su, Z Chen, S Deng, X Zhu… - … on Electron Devices, 2023 - ieeexplore.ieee.org
In this article, the degradation of 234 nm AlGaN-based far-UVC light-emitting diodes (LEDs)
under constant current stress is studied in-depth by the combination of optical and electrical …
under constant current stress is studied in-depth by the combination of optical and electrical …