Accurate and effective localization of reliability-critical gates (RCGs) is one of the important
prerequisites for low-cost circuit fault tolerance in the early stages of circuit design. This …

Traditionally, increasing logical masking probability has been used to improve the circuit
reliability against single-event transients (SETs). As the very first work, this paper presents a …

Radiation-induced soft errors have posed an ever increasing reliability challenge as device
dimensions keep shrinking in advanced CMOS technology. Therefore, it is imperative to …

In this paper, a resynthesis technique is introduced in order to reduce the Soft Error Rate
(SER) of combinational circuits. This technique is based on the circuit partitioning and a …

Heavy-ion irradiations of 14/16-nm node bulk FinFET combinational logic circuits under
different supply voltage and frequency are investigated. Results indicate that particle LET …

Electronic devices have ubiquitous presence in computing and communication, however
their reliability is of huge concern when used specifically in space, nuclear, and military …

Mission, safety, and business-critical applications need uninterrupted operation with correct
results. But due to the technology shrinking, the microelectronic circuits can be affected by …

Traditionally, increasing logical masking probability has been used to improve the circuit
reliability against Single-Event Transients (SETs). As the very first work, this paper presents …