In modern CMOS processes, soft errors and metastability are two prominent failure
mechanisms. Radiation induced single event upsets, or soft-errors, have become a …

For a network-on-chip (NoC) with multiple voltage/frequency domains, metastability hurts the
reliability during the clock-domain crossing, especially in the near-threshold-voltage (NTV) …

This article presents a technique titled metastability condition detection and correction
(MEDAC) that is featured in a near-threshold voltage (NTV) network-on-chip (NoC) …

Soft error has become an important reliability issue in advanced technologies. To tolerate
soft errors, solutions suggested in previous works incur significant performance and power …

Ultralow-power subthreshold logic circuits are becoming prominent in embedded
applications with limited energy budgets. Minimum energy consumption of digital logic …

C-elements are non-standard sequential logic gates employed in the design of eg
asynchronous circuits, clock generators and radiation-hardened circuits. Like any other …

In modern System on Chips (SoCs) different blocks may use clock signals with different
frequencies, in which case SoC is said to have multiple clock domains. The signal that …

The use of fine-grain Dynamic Voltage and Frequency Scaling (DVFS) has increased the
number of distinct clock domains on a given Network-on-Chip (NoC). This necessitates …

Synchronizer circuits having controllable metastability are provided, one of which includes: a
first flip-flop circuit comprising a first master latch connected in series with a first slave latch; …

The very large scale integration (VLSI) community has utilized aggressive complementary
metal-oxide semiconductor (CMOS) technology scaling to meet the ever-increasing …