Systematic review of class imbalance problems in manufacturing

A de Giorgio, G Cola, L Wang - Journal of Manufacturing Systems, 2023 - Elsevier
Class imbalance (CI) is a well-known problem in data science. Nowadays, it is affecting the
data modeling of many of the real-world processes that are being digitized. The …

Machine vision intelligence for product defect inspection based on deep learning and Hough transform

J Wang, P Fu, RX Gao - Journal of Manufacturing Systems, 2019 - Elsevier
Abstract Machine vision based product inspection methods have been widely investigated to
improve product quality and reduce labour costs. Recent advancement in deep learning …

Convolutional networks for voting-based anomaly classification in metal surface inspection

V Natarajan, TY Hung, S Vaikundam… - 2017 IEEE International …, 2017 - ieeexplore.ieee.org
Automated Visual Inspection (AVI) systems for metal surface inspection is increasingly used
in industries to aid human visual inspectors for classification of possible anomalies. For …

Anomaly detection through on-line isolation forest: An application to plasma etching

GA Susto, A Beghi, S McLoone - 2017 28th Annual SEMI …, 2017 - ieeexplore.ieee.org
Advanced Monitoring Systems are fundamental in advanced manufacturing for control,
quality and maintenance purposes. Nowadays, with the increasing availability of data in …

Automatic dimensional defect detection for glass vials based on machine vision: A heuristic segmentation method

M Eshkevari, MJ Rezaee, M Zarinbal… - Journal of Manufacturing …, 2021 - Elsevier
The vial, a bottle known to store the drug, should be controlled to meet the requirements of
the standard dimension. Due to problems with a visual inspection, there is a need to develop …

Weakly paired multimodal fusion for object recognition

H Liu, Y Wu, F Sun, B Fang… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
The ever-growing development of sensor technology has led to the use of multimodal
sensors to develop robotics and automation systems. It is therefore highly expected to …

Fault diagnosis of wafer acceptance test and chip probing between front-end-of-line and back-end-of-line processes

SKS Fan, CW Cheng, DM Tsai - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
With the rapid development of the semiconductor industry, fault diagnosis is an important
task in routine operations to determine the root cause for faults that occur. A tool in …

Milling tool wear state recognition by vibration signal using a stacked generalization ensemble model

Y Hui, X Mei, G Jiang, T Tao, C Pei, Z Ma - Shock and vibration, 2019 - Wiley Online Library
Milling tool wear state recognition plays an important role in controlling the quality of milled
parts and reducing machine tool downtime. However, the characteristics of milling process …

Industrial weak scratches inspection based on multifeature fusion network

X Tao, D Zhang, W Hou, W Ma… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Scratches are one of the most common defects in industrial manufacturing. Weak scratches
in the industrial environment have an ambiguous edge, low contrast, large span, and …

BO-SMOTE: A Novel Bayesian-Optimization-Based Synthetic Minority Oversampling Technique

S Yan, Z Zhao, S Liu, MC Zhou - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
An oversampling technique balances a dataset by increasing the number of minority
samples. It is a common and effective method in imbalanced learning. However, most …