Enhanced performance of an AlGaN-based deep-ultraviolet LED having graded quantum well structure

H Yu, Q Chen, Z Ren, M Tian, S Long… - IEEE photonics …, 2019 - ieeexplore.ieee.org
AlGaN-based deep ultraviolet light-emitting diodes (DUV LEDs) suffer from severe quantum
confined Stark effect (QCSE) due to the strong polarization field in the quantum wells (QWs) …

[HTML][HTML] Impact of N-plasma and Ga-irradiation on MoS2 layer in molecular beam epitaxy

P Mishra, M Tangi, TK Ng, MN Hedhili… - Applied Physics …, 2017 - pubs.aip.org
Recent interest in two-dimensional materials has resulted in ultra-thin devices based on the
transfer of transition metal dichalcogenides (TMDs) onto other TMDs or III-nitride materials …

Self-planarized quantum-disks-in-nanowires ultraviolet-B emitters utilizing pendeo-epitaxy

B Janjua, H Sun, C Zhao, DH Anjum, F Wu… - Nanoscale, 2017 - pubs.rsc.org
The growth of self-assembled, vertically oriented and uniform nanowires (NWs) has
remained a challenge for efficient light-emitting devices. Here, we demonstrate dislocation …

InGaN/GaN multiple quantum well photoanode modified with cobalt oxide for water oxidation

M Alqahtani, S Sathasivam, A Alhassan… - ACS Applied Energy …, 2018 - ACS Publications
Indium gallium nitride (InGaN) is an attractive semiconductor, with a tunable direct bandgap
for photoelectrochemical water splitting, but it corrodes in aqueous electrolytes. Cobalt oxide …

Heterogeneously integrated InGaN-based green microdisk light-emitters on Si (100)

X Zhang, Z Li, Y Zhang, X Wang, X Yi, G Wang, J Li - Optics Express, 2022 - opg.optica.org
Heterogeneous integration of nitrides on Si (100) is expected to open the door to the new
possibilities for this material system in the fields of high-speed integrated photonics and …

Assessing the Stress Induced by Novel Packaging in GaN HEMT Devices via Raman Spectroscopy

Z Dahrouch, G Malta, M d'Ambrosio, AA Messina… - Applied Sciences, 2024 - mdpi.com
Micro-Raman spectroscopy was carried out to evaluate the localized residual stresses in
commercial Gallium-Nitride-based devices, specifically, AlGaN/GaN high-electron-mobility …

GaSb MSM photodetectors on Si waveguides by rapid melt growth method

YH Chen, JW Jheng, P Mishra, CY Lin… - IEEE Photonics …, 2018 - ieeexplore.ieee.org
Metal-semiconductor-metal (MSM) photodetectors made of gallium antimonide (GaSb) on
silicon waveguides by the rapid melt growth method are investigated. By controlling the …

Improvement of emission efficiency with a sputtered AlN buffer layer in GaInN-based green light-emitting diodes

S Ishimoto, DP Han, K Yamamoto… - Japanese Journal of …, 2019 - iopscience.iop.org
We examined a sputtered AlN (sp-AlN) buffer layer to improve the emission efficiency of
GaInN-based green LEDs. Both the electroluminescence and photoluminescence emission …

Quantifying the Transverse-Electric-Dominant 260 nm Emission from Molecular Beam Epitaxy-Grown GaN-Quantum-Disks Embedded in AlN Nanowires: A …

RC Subedi, JW Min, S Mitra, KH Li, I Ajia… - … Applied Materials & …, 2020 - ACS Publications
There has been a relentless pursuit of transverse electric (TE)-dominant deep ultraviolet
(UV) optoelectronic devices for efficient surface emitters to replace the environmentally …

Correlation between pit formation and phase separation in thick InGaN film on a Si substrate

H Woo, Y Jo, J Kim, S Cho, CH Roh, JH Lee… - Current Applied …, 2018 - Elsevier
We demonstrate improved surface pit and phase separation in thick InGaN grown on a
GaN/Si (111) substrate, using plasma-assisted molecular beam epitaxy with an indium …