In atomic force microscopy a cantilever with a sharp tip attached to it is scanned over the
surface of a sample, and information about the surface is extracted by measuring how the …

Over the past several decades, atomic force microscopy (AFM) has advanced from a
technique used primarily for surface topography imaging to one capable of characterizing a …

Attractive and repulsive tip-sample interaction regimes of a force microscope operated with
an amplitude modulation feedback were investigated as a function of tip-sample separation …

We propose a method for mapping the composition of a surface by using an amplitude
modulation atomic force microscope operated without tip-surface mechanical contact. The …

When studying a mechanical system like an atomic force microscope (AFM) in dynamic
mode it is intuitive and instructive to analyse the forces involved in tip–sample interaction. A …

Atomic force acoustic microscopy is a near-field technique which combines the ability of
ultrasonics to image elastic properties with the high lateral resolution of scanning probe …

A nano-robotic manipulation system using an atomic force microscope probe as the pushing
manipulator and force and topology sensor is proposed. The task is the two-dimensional …

The conservative and dissipative forces between tip and sample of a dynamic atomic force
microscopy (AFM) were investigated using a combination of computer simulations and …

We demonstrate the accurate nanoscale mapping of near-surface loss and storage moduli
on a polystyrene–polypropylene blend with contact resonance force microscopy (CR-FM) …

Stiffness–load curves obtained in quantitative atomic force acoustic microscopy (AFAM)
measurements depend on both the elastic properties of the sample and the geometry of the …