The huge investment in the design and production of multicore processors may be put at risk
because the emerging highly miniaturized but unreliable fabrication technologies will …

This paper presents the Quick Error Detection (QED) technique for systematically creating
families of post-silicon validation tests that quickly detect bugs inside processor cores and …

Post-silicon validation is an essential part of modern integrated circuit design to capture
bugs and design errors that escape pre-silicon validation phase. A major problem governing …

During a processor development cycle, post-silicon validation is performed on the first
fabricated chip to detect and fix design errors. Design errors occur due to functional issues …

The memory consistency model (MCM), which formally specifies the behaviour of the
memory system, is used by programmers to reason about parallel programs. It is imperative …

We present a new technique for systematically creating postsilicon validation tests that
quickly detect bugs in processor cores and uncore components (cache controllers, memory …

Instruction-based or software-based self-testing (SBST) is a scalable functional testing
paradigm that has gained increasing acceptance in testing of single-threaded …

Post-silicon validation is as an important aspect of any integrated circuit design
methodology. The primary objective is to capture the bugs that have escaped the pre-silicon …

The complexity of modern chips intensifies verification challenges, and an increasing share
of this verification effort is shouldered by post-silicon validation. Focusing on the first silicon …

Past work has focused on detecting data races as proxies for Sequential Consistency (SC)
violations. However, most data races do not violate SC. In addition, lock-free data structures …