Over the years, FIB-SEM tomography has become an extremely important technique for the
three-dimensional reconstruction of microscopic structures with nanometric resolution. This …

Stripe noise from different remote sensing imaging systems varies considerably in terms of
response, length, angle, and periodicity. Due to the complex distributions of different stripes …

Scanning electron microscopy (SEM) imaging is able to visualize micro-to nano-structures of
cement and concrete. A prerequisite is that the sample preparation preserves the native …

In the last two decades, focused ion beam (FIB) systems have been used for sample
preparation. For example, the edges of a sample can be polished for analytical …

To provide useful materials characterization, we must prepare samples well so that we can
avoid studying artefacts induced during sample preparation. This motivates us to …

Focused ion beam scanning electron microscopy (FIB‐SEM) tomography is a serial
sectioning technique where an FIB mills off slices from the material sample that is being …

Highly-directional image artifacts such as ion mill curtaining, mechanical scratches, or image
striping from beam instability degrade the interpretability of micrographs. These unwanted …

The choice of materials that constitute electrodes and the way they are interconnected, ie,
the microstructure, influences the performance of lithium-ion batteries. For batteries with high …

Micro-compression tests were carried out on pillars of 60 μm in diameter, milled by plasma
focused ion beam in porous Yttria-Stabilized Zirconia (YSZ) pellets. The fracture properties …

The focused ion beam‐scanning electron microscope (FIB‐SEM) system plays a crucial role
in the research of shale reservoirs. It enables visualise nano‐scale pores and helps …