Secondary ion mass spectrometry
Secondary ion mass spectrometry (SIMS) is a technique for chemical analysis and imaging
of solid materials, with applications in many areas of science and technology. It involves …
of solid materials, with applications in many areas of science and technology. It involves …
[HTML][HTML] Insights into the interfacial speciation of Ni in the corrosion layer of high burnup Zircaloy-2 cladding: A combined XRD, XAS, and LFDFT study
G Kuri, H Ramanantoanina, S Bhattacharya, J Bertsch… - Corrosion …, 2023 - Elsevier
This work reports atomic-scale experimental and modeling studies of the zirconium oxide
microstructure formed at the metal-oxide (M/O) interface, and the crystallography as well as …
microstructure formed at the metal-oxide (M/O) interface, and the crystallography as well as …
Dynamic implantation–an improved approach for a large area SIMS measurement
C Höschen, J Lugmeier - Journal of Analytical Atomic Spectrometry, 2023 - pubs.rsc.org
Secondary ion mass spectrometry (SIMS) is applied to investigate chemical/elemental
composition of samples revealed by the secondary ions escaping the surface while …
composition of samples revealed by the secondary ions escaping the surface while …