Sensorless control of electric drives–a technological review

H Mohan, MK Pathak, SK Dwivedi - IETE Technical Review, 2020 - Taylor & Francis
Electric drive without electrical and mechanical sensors is the critical obligation in most of
the industrial applications due to its user-friendly hardware, lower maintenance, low cost …

Changes and challenges of photovoltaic inverter with silicon carbide device

Z Zeng, W Shao, H Chen, B Hu, W Chen, H Li… - … and Sustainable Energy …, 2017 - Elsevier
High efficiency, high power density, and high reliability are always the technical trends of
converters for renewable energy applications. Silicon carbide (SiC) devices can break …

Failure Analysis of 1200-V/150-A SiC MOSFET Under Repetitive Pulsed Overcurrent Conditions

JA Schrock, BN Pushpakaran, AV Bilbao… - … on Power Electronics, 2015 - ieeexplore.ieee.org
SiC MOSFETs are a leading option for increasing the power density of power electronics;
however, for these devices to supersede the Si insulated-gate bipolar transistor, their …

A temperature-dependent SPICE model of SiC power MOSFETs for within and out-of-SOA simulations

M Riccio, V d'Alessandro, G Romano… - … on power electronics, 2017 - ieeexplore.ieee.org
This paper presents a temperature-dependent SPICE model for SiC power MOSFETs. The
model describes the static and dynamic behavior and accounts for leakage current and …

A physics-based compact model of SiC power MOSFETs

R Kraus, A Castellazzi - IEEE Transactions on Power …, 2015 - ieeexplore.ieee.org
The presented compact model of SiC power MOSFETs is based on a thorough
consideration of the physical phenomena which are important for the device characteristics …

Multiobjective optimization of design of 4H-SiC power MOSFETs for specific applications

H Bencherif, L Dehimi, F Pezzimenti… - Journal of Electronic …, 2019 - Springer
The electrical characteristics of a 4H silicon carbide (4H-SiC) metal–oxide–semiconductor
field-effect transistor (MOSFET) have been investigated by using a multiobjective genetic …

Numerical simulation study of a low breakdown voltage 4H-SiC MOSFET for photovoltaic module-level applications

FG Della Corte, G De Martino… - … on Electron Devices, 2018 - ieeexplore.ieee.org
Silicon carbide (SiC) power MOSFETs are available only for high-power and medium-to-
high-voltage applications, generally above 600 V, because for lower blocking voltages, they …

Modeling of the SiO2/SiC Interface-Trapped Charge as a Function of the Surface Potential in 4H-SiC Vertical-DMOSFET

GD Licciardo, L Di Benedetto… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
A new analytical description of the trapped charge distribution at the semiconductor-
insulator interface of 4H-SiC vertical-DMOSFET has been derived as a function of the …

A model of electric field distribution in gate oxide and JFET-region of 4H-SiC DMOSFETs

L Di Benedetto, GD Licciardo… - … on Electron Devices, 2016 - ieeexplore.ieee.org
For the first time, a full analytical model of the electric field in the gate oxide of 4H-polytype
silicon carbide (4H-SiC) power double-implanted MOSFET devices is shown. It takes into …

Short-circuit failure model of SiC MOSFET including the interface trapped charges

Y Zhou, H Liu, S Mu, Z Chen… - IEEE Journal of Emerging …, 2019 - ieeexplore.ieee.org
This article has presented a physics-based model which replicates the failure of SiC
MOSFET under short-circuit (SC) case. The model is constructed on the base of the …