Mechanical properties of nanoparticles: basics and applications
D Guo, G Xie, J Luo - Journal of physics D: applied physics, 2013 - iopscience.iop.org
The special mechanical properties of nanoparticles allow for novel applications in many
fields, eg, surface engineering, tribology and nanomanufacturing/nanofabrication. In this …
fields, eg, surface engineering, tribology and nanomanufacturing/nanofabrication. In this …
[HTML][HTML] Low-intensity ultrasound induced cavitation and streaming in oxygen-supersaturated water: Role of cavitation bubbles as physical cleaning agents
T Yamashita, K Ando - Ultrasonics Sonochemistry, 2019 - Elsevier
A number of acoustic and fluid-dynamic phenomena appear in ultrasonic cleaning baths
and contribute to physical cleaning of immersed surfaces. Propagation and repeated …
and contribute to physical cleaning of immersed surfaces. Propagation and repeated …
Recent advances and future developments in PVA brush scrubbing cleaning: a review
S Zhang, F Wang, B Tan, W Li, B Gao, Y He - Materials Science in …, 2022 - Elsevier
As semiconductor integrated circuits (SICs) have been developed to scale down to obtain
higher integration and better performance, more chemical mechanical polishing (CMP) …
higher integration and better performance, more chemical mechanical polishing (CMP) …
Almost complete removal of ceria particles down to 10 nm size from silicon dioxide surfaces
It has been very difficult to remove smaller ceria particles from silicon dioxide surfaces. One
of the likely reasons is that the smaller ceria particles with a higher surface concentration of …
of the likely reasons is that the smaller ceria particles with a higher surface concentration of …
Simulation of high-speed droplet impact against a dry/wet rigid wall for understanding the mechanism of liquid jet cleaning
T Kondo, K Ando - Physics of Fluids, 2019 - pubs.aip.org
Physical cleaning techniques are of great concern to remove particulate contamination
because of their low environmental impact. One of the promising candidates is based on …
because of their low environmental impact. One of the promising candidates is based on …
The role of carboxylic acids on nanoparticle removal in post CMP cleaning process for cobalt interconnects
L Zhang, X Lu, AA Busnaina - Materials Chemistry and Physics, 2022 - Elsevier
As the technology node moves below 10 nm, cobalt with its low resistivity, superior adhesion
property, and wettability with copper, promises to change the conductor landscape in many …
property, and wettability with copper, promises to change the conductor landscape in many …
Cleaning solutions for removal of∼ 30 nm ceria particles from proline and citric acid containing slurries deposited on silicon dioxide and silicon nitride surfaces
A previously developed aqueous cleaning solution (4.2 mol l− 1 each of H 2 O 2 and NH 4
OH) was found to be ineffective in cleaning oxide/nitride surfaces after contamination with …
OH) was found to be ineffective in cleaning oxide/nitride surfaces after contamination with …
Study of the cross contamination effect on post CMP in situ cleaning process
Scaling of gate lengths has led to significant improvement in semiconductor device
performance. However, fabrication complexities have also increased and surface defects …
performance. However, fabrication complexities have also increased and surface defects …
Droplets impact against the random rough surface with a liquid film
J Huo, L Wang, J Tang, X Shi - Physics of Fluids, 2023 - pubs.aip.org
Aero-engine fouling will affect the economy and safety of aircraft, and online washing is the
main method to solve the problem of aero-engine fouling. Online washing is considered to …
main method to solve the problem of aero-engine fouling. Online washing is considered to …
Mechanical effect of colloidal silica in copper chemical mechanical planarization
H Lee, S Joo, H Jeong - Journal of Materials Processing Technology, 2009 - Elsevier
The mechanical effect of colloidal silica concentration in copper chemical mechanical
planarization (CMP) is considered in this paper by using friction force monitoring system …
planarization (CMP) is considered in this paper by using friction force monitoring system …