Mechanical properties of nanoparticles: basics and applications

D Guo, G Xie, J Luo - Journal of physics D: applied physics, 2013 - iopscience.iop.org
The special mechanical properties of nanoparticles allow for novel applications in many
fields, eg, surface engineering, tribology and nanomanufacturing/nanofabrication. In this …

[HTML][HTML] Low-intensity ultrasound induced cavitation and streaming in oxygen-supersaturated water: Role of cavitation bubbles as physical cleaning agents

T Yamashita, K Ando - Ultrasonics Sonochemistry, 2019 - Elsevier
A number of acoustic and fluid-dynamic phenomena appear in ultrasonic cleaning baths
and contribute to physical cleaning of immersed surfaces. Propagation and repeated …

Recent advances and future developments in PVA brush scrubbing cleaning: a review

S Zhang, F Wang, B Tan, W Li, B Gao, Y He - Materials Science in …, 2022 - Elsevier
As semiconductor integrated circuits (SICs) have been developed to scale down to obtain
higher integration and better performance, more chemical mechanical polishing (CMP) …

Almost complete removal of ceria particles down to 10 nm size from silicon dioxide surfaces

J Seo, A Gowda, SV Babu - ECS Journal of Solid State Science …, 2018 - iopscience.iop.org
It has been very difficult to remove smaller ceria particles from silicon dioxide surfaces. One
of the likely reasons is that the smaller ceria particles with a higher surface concentration of …

Simulation of high-speed droplet impact against a dry/wet rigid wall for understanding the mechanism of liquid jet cleaning

T Kondo, K Ando - Physics of Fluids, 2019 - pubs.aip.org
Physical cleaning techniques are of great concern to remove particulate contamination
because of their low environmental impact. One of the promising candidates is based on …

The role of carboxylic acids on nanoparticle removal in post CMP cleaning process for cobalt interconnects

L Zhang, X Lu, AA Busnaina - Materials Chemistry and Physics, 2022 - Elsevier
As the technology node moves below 10 nm, cobalt with its low resistivity, superior adhesion
property, and wettability with copper, promises to change the conductor landscape in many …

Cleaning solutions for removal of∼ 30 nm ceria particles from proline and citric acid containing slurries deposited on silicon dioxide and silicon nitride surfaces

A Gowda, J Seo, CK Ranaweera… - ECS Journal of Solid …, 2020 - iopscience.iop.org
A previously developed aqueous cleaning solution (4.2 mol l− 1 each of H 2 O 2 and NH 4
OH) was found to be ineffective in cleaning oxide/nitride surfaces after contamination with …

Study of the cross contamination effect on post CMP in situ cleaning process

HJ Kim, G Bohra, H Yang, SG Ahn, L Qin… - Microelectronic …, 2015 - Elsevier
Scaling of gate lengths has led to significant improvement in semiconductor device
performance. However, fabrication complexities have also increased and surface defects …

Droplets impact against the random rough surface with a liquid film

J Huo, L Wang, J Tang, X Shi - Physics of Fluids, 2023 - pubs.aip.org
Aero-engine fouling will affect the economy and safety of aircraft, and online washing is the
main method to solve the problem of aero-engine fouling. Online washing is considered to …

Mechanical effect of colloidal silica in copper chemical mechanical planarization

H Lee, S Joo, H Jeong - Journal of Materials Processing Technology, 2009 - Elsevier
The mechanical effect of colloidal silica concentration in copper chemical mechanical
planarization (CMP) is considered in this paper by using friction force monitoring system …