Multimodal atomic force microscopy with optimized higher eigenmode sensitivity using on-chip piezoelectric actuation and sensing
Atomic force microscope (AFM) cantilevers with integrated actuation and sensing provide
several distinct advantages over conventional cantilever instrumentation. These include …
several distinct advantages over conventional cantilever instrumentation. These include …
Soft three-dimensional microscale vibratory platforms for characterization of nano-thin polymer films
Vibrational resonances of microelectromechanical systems (MEMS) can serve as means for
assessing physical properties of ultrathin coatings in sensors and analytical platforms. Most …
assessing physical properties of ultrathin coatings in sensors and analytical platforms. Most …
On-chip feedthrough cancellation methods for microfabricated AFM cantilevers with integrated piezoelectric transducers
Active microcantilevers with on-chip sensing and actuation capabilities provide significant
advantages in tapping-mode atomic force microscopy. The collocated transduction in active …
advantages in tapping-mode atomic force microscopy. The collocated transduction in active …
Active atomic force microscope cantilevers with integrated device layer piezoresistive sensors
Active atomic force microscope cantilevers with on-chip actuation and sensing provide
several advantages over passive cantilevers which rely on piezoacoustic base-excitation …
several advantages over passive cantilevers which rely on piezoacoustic base-excitation …
Note: Guaranteed collocated multimode control of an atomic force microscope cantilever using on-chip piezoelectric actuation and sensing
MG Ruppert, YK Yong - Review of Scientific Instruments, 2017 - pubs.aip.org
The quality (Q) factor is an important parameter of the resonance of the microcantilever as it
determines both imaging bandwidth and force sensitivity. The ability to control the Q factor of …
determines both imaging bandwidth and force sensitivity. The ability to control the Q factor of …
AFM Cantilever Design for Multimode Q Control: Arbitrary Placement of Higher Order Modes
In the fast growing field of multifrequency atomic force microscopy (AFM), the benefits of
using higher order modes have been extensively reported on. However, higher modes of …
using higher order modes have been extensively reported on. However, higher modes of …
Simultaneous tip force and displacement sensing for AFM cantilevers with on-chip actuation: Design and characterization for off-resonance tapping mode
The use of integrated on-chip actuation simplifies the identification of a cantilever
resonance, can improve imaging speed, and enables the use of smaller cantilevers, which is …
resonance, can improve imaging speed, and enables the use of smaller cantilevers, which is …
Experimental analysis of tip vibrations at higher eigenmodes of QPlus sensors for atomic force microscopy
QPlus sensors are non-contact atomic force microscope probes constructed from a quartz
tuning fork and a tungsten wire with an electrochemically etched tip. These probes are self …
tuning fork and a tungsten wire with an electrochemically etched tip. These probes are self …
Characterization of active microcantilevers using laser doppler vibrometry
Active atomic force microscope cantilevers with on-chip actuation and sensing provide
several advantages over passive cantilevers which rely on piezoacoustic base-excitation …
several advantages over passive cantilevers which rely on piezoacoustic base-excitation …
Integrated force and displacement sensing in active microcantilevers for off-resonance tapping mode atomic force microscopy
Integrated on-chip actuation and sensing in micro-cantilevers for atomic force microscopy
(AFM) allows faster scanning speeds, cleaner frequency responses and smaller cantilevers …
(AFM) allows faster scanning speeds, cleaner frequency responses and smaller cantilevers …