Molecular beam epitaxy growth of GaN, AlN and InN

X Wang, A Yoshikawa - Progress in crystal growth and characterization of …, 2004 - Elsevier
III-Nitrides receive much research attention and obtain significant development due to their
wide applications in light emitting diodes, laser diodes, ultraviolet detectors, solar cells, field …

Rare-earth-doped GaN: growth, properties, and fabrication of electroluminescent devices

AJ Steckl, JC Heikenfeld, DS Lee… - IEEE Journal of …, 2002 - ieeexplore.ieee.org
A review is presented of the fabrication, operation, and applications of rare-earth-doped
GaN electroluminescent devices (ELDs). GaN: RE ELDs emit light due to impact excitation of …

Strategy toward white LEDs based on vertically integrated rare earth doped Ga2O3 films

Y Huang, K Saito, T Tanaka, Q Guo - Applied Physics Letters, 2021 - pubs.aip.org
Monolithic and phosphor-free light-emitting diodes (LEDs) have been fabricated based on
vertically integrated Ga 2 O 3: Tm, Ga 2 O 3: Eu, and Ga 2 O 3: Er films by alternate-target …

Three-color integration on rare-earth-doped GaN electroluminescent thin films

YQ Wang, AJ Steckl - Applied Physics Letters, 2003 - pubs.aip.org
We have realized full color integration on rare-earth-doped thin-film electroluminescent EL
GaN using lateral integration. Tm, Er, and Eu dopants were in situ doped into GaN thin films …

Yellow emission from vertically integrated Ga2O3 doped with Er and Eu electroluminescent film

G Deng, Y Huang, Z Chen, C Pan, K Saito… - Journal of …, 2021 - Elsevier
Yellow color from vertically integrated light emitting device (LED) was reported. The
multilayer structured Er and Eu doped Ga 2 O 3 films were deposited on sapphire and GaAs …

Transmission electron microscopy investigation of the structural damage formed in GaN by medium range energy rare earth ion implantation

F Gloux, T Wojtowicz, P Ruterana, K Lorenz… - Journal of applied …, 2006 - pubs.aip.org
The crystallographic nature of the damage created in GaN by 300 keV rare earth ions has
been investigated following implantation at room temperature by varying the fluence of Er …

A mechanism for damage formation in GaN during rare earth ion implantation at medium range energy and room temperature

P Ruterana, B Lacroix, K Lorenz - Journal of Applied Physics, 2011 - pubs.aip.org
A detailed investigation of the crystallographic damage has been carried out in GaN
following 300 keV rare earth ion implantation at room temperature by varying the fluence …

Luminescence from metal-oxide-semiconductor devices with Eu3+-doped CeO2 films on silicon: From broadband to monochromatic emission

C Lv, Q Zhang, Y Zhang, T Pang, W Xiang - Journal of Luminescence, 2023 - Elsevier
We report on the transformation from broadband to monochromatic orange-red emission for
the electroluminescence (EL) from the metal-oxide-semiconductor (MOS) devices with …

Investigation of optical and electrical properties of erbium-doped TiO2 thin films for photodetector applications

S Mondal, A Ghosh, MR Piton, JP Gomes… - Journal of Materials …, 2018 - Springer
We have investigated the electrical and optical properties of erbium (Er 3+) doped TiO 2 thin
films (Er: TiO 2 TFs) grown by sol–gel technique on glass and silicon substrates. The …

Exploring optical properties of Gd doped zincblende GaN for novel optoelectronic applications (A DFT+ U study)

MJI Khan, Z Kanwal, N Usmani, P Akhtar… - Materials Research …, 2019 - iopscience.iop.org
In current research, we investigate optical properties of Gd doped zincblende GaN using
Wien2K code, by employing DFT+ U. We consider pure GaN and we dope various Gd …