Packaging effect on MEMS pressure sensor performance

RH Krondorfer, YK Kim - IEEE Transactions on Components …, 2007 - ieeexplore.ieee.org
In this study, the effect of epoxy based molding compound packaging on a micro-electro-
mechanical system (MEMS) pressure sensor performance is investigated. A series of …

Strain-controlled domain wall injection into nanowires for sensor applications

G Masciocchi, M Fattouhi, A Kehlberger… - Journal of Applied …, 2021 - pubs.aip.org
We investigate experimentally the effects of strain on the injection of 180 domain walls
(DWs) from a nucleation pad into magnetic nanowires, as typically used for DW-based …

Thermomechanics of photovoltaic modules

U Eitner - 2011 - repo.bibliothek.uni-halle.de
Photovoltaics (PV) is one major pillar in the renewable energy portfolio of wind, water,
biomass, solar thermal and geothermal power. Driven by the urgent necessity to reduce …

Characterization of the viscoelastic properties of an epoxy molding compound during cure

M Sadeghinia, KMB Jansen, LJ Ernst - Microelectronics Reliability, 2012 - Elsevier
In the electronics industry epoxy molding compounds, underfills and adhesives are used for
the packaging of electronic components. These materials are applied in liquid form, cured at …

Effect of silicon anisotropy on interfacial fracture for three dimensional through-silicon-via (TSV) under thermal loading

Y Dai, M Zhang, F Qin, P Chen, T An - Engineering Fracture Mechanics, 2019 - Elsevier
The anisotropy property of silicon is a basic property which has been discussed widely in the
reliability assessment of electronic components. However, the effect of silicon anisotropy on …

The effect of epoxy molding compound on thermal/residual deformations and stresses in IC packages during manufacturing process

MY Tsai, CT Wang, CH Hsu - IEEE transactions on components …, 2006 - ieeexplore.ieee.org
Thermal/residual deformations and stresses in plastic integrated circuit (IC) packages
caused by epoxy molding compound (EMC) during the manufacturing process are …

Driving mechanisms of delamination related reliability problems in exposed pad packages

WD van Driel, MAJ van Gils, X Fan… - … on Components and …, 2008 - ieeexplore.ieee.org
Exposed pad packages were introduced in the late 1980s and early 1990s because of their
excellent thermal and electrical performance. Despite these advantages, the exposed pad …

Measurement of elastic properties of epoxy molding compound by single cylindrical configuration with embedded fiber Bragg grating sensor

Y Sun, HS Lee, B Han - Experimental mechanics, 2017 - Springer
We propose a novel experimental method, based on a fiber Bragg grating (FBG) sensor, to
measure the elastic properties of epoxy molding compound (EMC) from a single specimen …

Prediction of delamination related IC & packaging reliability problems

WD Van Driel, MAJ van Gils, RBR van Silfhout… - Microelectronics …, 2005 - Elsevier
This paper presents our effort to predict delamination related IC & packaging reliability
problems. These reliability problems are driven by the mismatch between the different …

Characterization of linear viscoelastic behavior of epoxy molding compound subjected to uniaxial compression and hydrostatic pressure

HS Lee, Y Sun, C Kim, B Han - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
The linear viscoelastic properties of epoxy molding compound (EMC) are measured by an
embedded fiber Bragg grating (FBG) sensor. A single cylindrical EMC specimen is …