Radiation chemistry in chemically amplified resists

T Kozawa, S Tagawa - Japanese Journal of Applied Physics, 2010 - iopscience.iop.org
Historically, in the mass production of semiconductor devices, exposure tools have been
repeatedly replaced with those with a shorter wavelength to meet the resolution …

[图书][B] Microlithography: science and technology

BW Smith, K Suzuki - 2018 - taylorfrancis.com
This new edition of the bestselling Microlithography: Science and Technology provides a
balanced treatment of theoretical and operational considerations, from elementary concepts …

Corrections to proximity effects in electron beam lithography. I. Theory

M Parikh - Journal of Applied Physics, 1979 - pubs.aip.org
Electron lithography at micrometer dimensions suffers from a seemingly fatal problem due to
proximity effects. Three corrections techniques are discussed. The self‐consistent technique …

[图书][B] Electron-beam technology in microelectronic fabrication

G Brewer - 2012 - books.google.com
Electron-Beam Technology in Microelectronic Fabrication presents a unified description of
the technology of high resolution lithography. This book is organized into six chapters, each …

Nanofabrication

CRK Marrian, DM Tennant - Journal of Vacuum Science & Technology …, 2003 - pubs.aip.org
In this the 50th anniversary year of the AVS and the AVS Symposium, this article is offered
as one in a series of topical review articles to celebrate the role of this community to the …

Electron beam lithography

RFW Pease - Contemporary Physics, 1981 - Taylor & Francis
Electron beam lithography means writing patterns in thin films of electron sensitive material
using a finely focused (sub-micrometre diameter) electron beam. By combining electrical …

Monte Carlo simulation of fast secondary electron production in electron beam resists

K Murata, DF Kyser, CH Ting - Journal of Applied Physics, 1981 - pubs.aip.org
The interaction of an incident electron beam with resist films and substrates gives rise to an
electron distribution in the resist and which causes the so-called proximity effect in electron …

An analytical model of SEM and STEM charge collection images of dislocations in thin semiconductor layers: I. Minority carrier generation, diffusion, and collection

C Donolato - physica status solidi (a), 1981 - Wiley Online Library
A three‐dimensional analysis is given of the generation, diffusion, and collection of minority
carriers injected by an electron beam in a semiconductor containing ap–n junction parallel …

Electron‐Beam–Induced Nanometer‐Scale Deposition

N Silvis-Cividjian, CW Hagen - Advances in Imaging and Electron Physics, 2006 - Elsevier
Publisher Summary Electron beam-induced deposition (EBID) is a technique to directly
deposit structures on a target by the electron‐induced dissociation of adsorbed precursor …

Fabrication techniques for surface-acoustic-wave and thin-film optical devices

HI Smith - Proceedings of the IEEE, 1974 - ieeexplore.ieee.org
The techniques of photolithography, electron lithography, X-ray lithography, ion
bombardment etching, and liftoff are reviewed, and their advantages and disadvantages …