High-performance temperature sensor based on 4H-SiC Schottky diodes

S Rao, G Pangallo, F Pezzimenti… - IEEE Electron Device …, 2015 - ieeexplore.ieee.org
A high-performance temperature sensor based on coupled 4H-SiC Schottky diodes is
presented. The linear dependence on temperature of the difference between the forward …

Current-voltage analytical model and multiobjective optimization of design of a short channel gate-all-around-junctionless MOSFET

F Pezzimenti, H Bencherif, A Yousfi, L Dehimi - Solid-State Electronics, 2019 - Elsevier
In this paper we investigate the optimized design of a short channel gate-all-around-
junctionless (GAAJ) metal-oxidesemiconductor field-effect-transistor (MOSFET), including …

4H-SiC pin diode as highly linear temperature sensor

S Rao, G Pangallo… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
The linear dependence on temperature of the voltage drop VD across a forward-biased 4H-
SiC pin diode is investigated experimentally. The results show that the fabricated …

Analysis of trapping effects on the forward current–voltage characteristics of Al-implanted 4H-SiC pin diodes

ML Megherbi, F Pezzimenti, L Dehimi… - … on Electron Devices, 2018 - ieeexplore.ieee.org
The forward current-voltage characteristics (IF-VF) of aluminum (Al)-implanted 4H-SiC pin
diodes are investigated by means of a numerical simulation study that takes into account …

Numerical simulation study of a low breakdown voltage 4H-SiC MOSFET for photovoltaic module-level applications

FG Della Corte, G De Martino… - … on Electron Devices, 2018 - ieeexplore.ieee.org
Silicon carbide (SiC) power MOSFETs are available only for high-power and medium-to-
high-voltage applications, generally above 600 V, because for lower blocking voltages, they …

Analysis of the Forward IV Characteristics of Al-Implanted 4H-SiC p-i-n Diodes with Modeling of Recombination and Trapping Effects Due to Intrinsic and Doping …

ML Megherbi, F Pezzimenti, L Dehimi… - Journal of Electronic …, 2018 - Springer
In this paper, the impact of silicon carbide intrinsic defect states, such as Z 1/2 and EH 6/7
centers, on the forward current–voltage curves of aluminum (Al)-implanted 4H-SiC pin …

Numerical simulations of the electrical transport characteristics of a Pt/n-GaN Schottky diode

F Bouzid, F Pezzimenti, L Dehimi… - Japanese Journal of …, 2017 - iopscience.iop.org
In this paper, using a numerical simulator, we investigated the current–voltage
characteristics of a Pt/n-GaN thin Schottky diode on the basis of the thermionic emission (TE) …

Current-voltage characteristics of neutron irradiated nanocrystalline silicon carbide (3CSiC)

EM Huseynov - Physica B: Condensed Matter, 2018 - Elsevier
At the present work, nanocrystalline silicon carbide (3Csingle bondSiC) irradiated by
neutrons (2× 10 13 n/cm 2 s) up to 20 h. The current–voltage (Isingle bondV) characteristics …

Analysis of the electrical characteristics of Mo/4H-SiC Schottky barrier diodes for temperature-sensing applications

K Zeghdar, L Dehimi, F Pezzimenti… - Journal of Electronic …, 2020 - Springer
The experimental forward current–voltage–temperature (ID–VD–T) characteristics of Mo/4H-
SiC Schottky barrier diodes are investigated by means of a careful simulation study. The …

Design and numerical characterization of a low voltage power MOSFET in 4H-SiC for photovoltaic applications

G De Martino, F Pezzimenti… - … 13th Conference on …, 2017 - ieeexplore.ieee.org
Higher efficiency in photovoltaic (PV) conversion calls for the use of small Maximum Power
Point Trackers (MPPT) to be placed on board the PV modules. Such circuits require in turn …